Assignee
DCG SYSTEMS INC
US·44 granted patents·10 pending applications·390 citations·filing 2004–2019
Top patents by PatentIndex Score
54 records- 0194US7842920B2Methods and systems of performing device failure analysis, electrical characterization and physical characterizationDCG SYSTEMS INC·Filed 2007·Granted Nov 30, 2010·18 cites·24 claims
- 0294US7786436B1FIB based open via analysis and repairDCG SYSTEMS INC·Filed 2007·Granted Aug 31, 2010·78 cites·20 claims
- 0393US7450245B2Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing systemDCG SYSTEMS INC·Filed 2006·Granted Nov 11, 2008·26 cites·32 claims
- 0492US7733100B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2006·Granted Jun 8, 2010·16 cites·29 claims
- 0592US7659981B2Apparatus and method for probing integrated circuits using polarization difference probingDCG SYSTEMS INC·Filed 2005·Granted Feb 9, 2010·36 cites·30 claims
- 0691US7990167B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2009·Granted Aug 2, 2011·13 cites·20 claims
- 0789US7639025B2Collection optics integrating an objective and a SILDCG SYSTEMS INC·Filed 2006·Granted Dec 29, 2009·18 cites·20 claims
- 0888US9201096B2Laser-assisted device alteration using synchronized laser pulsesDCG SYSTEMS INC·Filed 2013·Granted Dec 1, 2015·7 cites·20 claims
- 0988US7492529B2Bi-convex solid immersion lensDCG SYSTEMS INC·Filed 2007·Granted Feb 17, 2009·9 cites·38 claims
- 1086US8895923B2System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingDCG SYSTEMS INC·Filed 2013·Granted Nov 25, 2014·7 cites·20 claims
- 1185US10539589B2Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobingDCG SYSTEMS INC·Filed 2015·Granted Jan 21, 2020·7 cites·23 claims
- 1285US9057740B1Probe-based data collection system with adaptive mode of probingDCG SYSTEMS INC·Filed 2013·Granted Jun 16, 2015·7 cites·20 claims
- 1385US7466852B2Time resolved non-invasive diagnostics systemDCG SYSTEMS INC·Filed 2007·Granted Dec 16, 2008·11 cites·34 claims
- 1485US7439730B2Apparatus and method for detecting photon emissions from transistorsDCG SYSTEMS INC·Filed 2005·Granted Oct 21, 2008·10 cites·26 claims
- 1584US7883630B2FIB milling of copper over organic dielectricsDCG SYSTEMS INC·Filed 2008·Granted Feb 8, 2011·7 cites·16 claims
- 1683US9239357B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2012·Granted Jan 19, 2016·3 cites·17 claims
- 1780US7616312B2Apparatus and method for probing integrated circuits using laser illuminationDCG SYSTEMS INC·Filed 2005·Granted Nov 10, 2009·12 cites·55 claims
- 1880US7573050B2Column simultaneously focusing a particle beam and an optical beamDCG SYSTEMS INC·Filed 2007·Granted Aug 11, 2009·5 cites·19 claims
- 1980US7504845B2Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysisDCG SYSTEMS INC·Filed 2005·Granted Mar 17, 2009·7 cites·13 claims
- 2079US9244121B2Systems and method for laser voltage imaging state mappingDCG SYSTEMS INC·Filed 2014·Granted Jan 26, 2016·5 cites·15 claims
- 2179US7679358B2System and method for voltage noise and jitter measurement using time-resolved emissionDCG SYSTEMS INC·Filed 2007·Granted Mar 16, 2010·9 cites·13 claims
- 2278US9098892B2Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDCG SYSTEMS INC·Filed 2014·Granted Aug 4, 2015·3 cites·18 claims
- 2378US7535000B2Method and system for identifying events in FIBDCG SYSTEMS INC·Filed 2006·Granted May 19, 2009·4 cites·42 claims
- 2477US9322715B2Three-dimensional hot spot localizationDCG SYSTEMS INC·Filed 2014·Granted Apr 26, 2016·3 cites·20 claims
- 2577US7612321B2Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized mannerDCG SYSTEMS INC·Filed 2005·Granted Nov 3, 2009·7 cites·16 claims
- 2675US7530034B2Apparatus and method for circuit operation definitionDCG SYSTEMS INC·Filed 2006·Granted May 5, 2009·10 cites·20 claims
- 2773US7884024B2Apparatus and method for optical interference fringe based integrated circuit processingDCG SYSTEMS INC·Filed 2007·Granted Feb 8, 2011·4 cites·20 claims
- 2872US9506947B2System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingDCG SYSTEMS INC·Filed 2014·Granted Nov 29, 2016·2 cites·18 claims
- 2972US7539966B2Enhanced OP3 algorithms for net cuts, net joins, and probe points for a digital designDCG SYSTEMS INC·Filed 2006·Granted May 26, 2009·9 cites·28 claims
- 3071US10545186B2Method and system for resolving hot spots in LITDCG SYSTEMS INC·Filed 2014·Granted Jan 28, 2020·1 cites·23 claims
- 3171US7480051B2Apparatus and method for hard-docking a tester to a tiltable imagerDCG SYSTEMS INC·Filed 2005·Granted Jan 20, 2009·6 cites·21 claims
- 3269US9869696B2Method for imaging a feature using a scanning probe microscopeDCG SYSTEMS INC·Filed 2016·Granted Jan 16, 2018·1 cites·22 claims
- 3368US7636155B2System and method for resolving photoemission from semiconductor devicesDCG SYSTEMS INC·Filed 2007·Granted Dec 22, 2009·5 cites·20 claims
- 3465US7956625B1Undoped silicon heat spreader windowDCG SYSTEMS INC·Filed 2006·Granted Jun 7, 2011·4 cites·15 claims
- 3563US10191111B2Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsetsDCG SYSTEMS INC·Filed 2014·Granted Jan 29, 2019·1 cites·39 claims
- 3663US7409653B2Sub-resolution alignment of imagesDCG SYSTEMS INC·Filed 2004·Granted Aug 5, 2008·9 cites·35 claims
- 3761US11047906B2Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsetsDCG SYSTEMS INC·Filed 2019·Granted Jun 29, 2021·0 cites·25 claims
- 3861US9915700B2System and method for modulation mappingDCG SYSTEMS INC·Filed 2016·Granted Mar 13, 2018·0 cites·21 claims
- 3957US7478345B2Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuitsDCG SYSTEMS INC·Filed 2005·Granted Jan 13, 2009·2 cites·32 claims
- 4057US2014191111A1Accumulating optical detector with shutter emulationDCG SYSTEMS INC·Filed 2013·Application pending·0 cites
- 4156US9064083B2P and N region differentiation for image-to-CAD alignmentDCG SYSTEMS INC·Filed 2013·Granted Jun 23, 2015·1 cites·22 claims
- 4249US7439168B2Apparatus and method of forming silicide in a localized mannerDCG SYSTEMS INC·Filed 2004·Granted Oct 21, 2008·7 cites·12 claims
- 4349US2014380531A1Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesDCG SYSTEMS INC·Filed 2014·Application pending·0 cites
- 4448US9361533B2Apparatus and method for polarization diversity imaging and alignmentDCG SYSTEMS INC·Filed 2012·Granted Jun 7, 2016·0 cites·20 claims
- 4548US2016139200A1Systems and method for laser voltage imaging state mappingDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
- 4647US9885878B2Apparatus and method for annular optical power managementDCG SYSTEMS INC·Filed 2014·Granted Feb 6, 2018·0 cites·23 claims
- 4747US2015338458A1Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite sideDCG SYSTEMS INC·Filed 2015·Application pending·0 cites
- 4845US7697146B2Apparatus and method for optical interference fringe based integrated circuit processingDCG SYSTEMS INC·Filed 2006·Granted Apr 13, 2010·0 cites·26 claims
- 4945US2008298719A1Sub-resolution alignment of imagesDCG SYSTEMS INC·Filed 2008·Application pending·0 cites
- 5041US2010039117A1Temperature control system for a device under testDCG SYSTEMS INC·Filed 2009·Application pending·0 cites
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