Assignee
FRACTILIA LLC
US·20 granted patents·5 pending applications·142 citations·filing 2018–2024
Top patents by PatentIndex Score
25 records- 0198US10176966B1Edge detection systemFRACTILIA LLC·Filed 2018·Granted Jan 8, 2019·35 cites·50 claims
- 0296US10665418B2System and method for generating and analyzing roughness measurementsFRACTILIA LLC·Filed 2019·Granted May 26, 2020·10 cites·20 claims
- 0396US10522322B2System and method for generating and analyzing roughness measurementsFRACTILIA LLC·Filed 2018·Granted Dec 31, 2019·13 cites·23 claims
- 0496US10488188B2System and method for removing noise from roughness measurementsFRACTILIA LLC·Filed 2018·Granted Nov 26, 2019·13 cites·28 claims
- 0595US10665417B2System and method for generating and analyzing roughness measurementsFRACTILIA LLC·Filed 2019·Granted May 26, 2020·10 cites·20 claims
- 0695US10656532B2Edge detection system and its use for optical proximity correctionFRACTILIA LLC·Filed 2019·Granted May 19, 2020·13 cites·20 claims
- 0794US10664955B2Edge detection system and its use for machine learningFRACTILIA LLC·Filed 2019·Granted May 26, 2020·14 cites·20 claims
- 0893US11380516B2System and method for generating and analyzing roughness measurements and their use for process monitoring and controlFRACTILIA LLC·Filed 2020·Granted Jul 5, 2022·2 cites·20 claims
- 0993US10648801B2System and method for generating and analyzing roughness measurements and their use for process monitoring and controlFRACTILIA LLC·Filed 2019·Granted May 12, 2020·12 cites·20 claims
- 1093US10510509B2Edge detection systemFRACTILIA LLC·Filed 2018·Granted Dec 17, 2019·8 cites·20 claims
- 1190US11996265B2System and method for generating and analyzing roughness measurements and their use for process monitoring and controlFRACTILIA LLC·Filed 2022·Granted May 28, 2024·1 cites·20 claims
- 1290US11355306B2System and method for generating and analyzing roughness measurements and their use for process monitoring and controlFRACTILIA LLC·Filed 2020·Granted Jun 7, 2022·2 cites·20 claims
- 1389US11004653B2Edge detection systemFRACTILIA LLC·Filed 2019·Granted May 11, 2021·4 cites·24 claims
- 1488US11004654B2System and method for generating and analyzing roughness measurementsFRACTILIA LLC·Filed 2019·Granted May 11, 2021·3 cites·20 claims
- 1587US11670480B2System and method for generating and analyzing roughness measurementsFRACTILIA LLC·Filed 2021·Granted Jun 6, 2023·1 cites·20 claims
- 1685US11361937B2System and method for generating and analyzing roughness measurements and their use for process monitoring and controlFRACTILIA LLC·Filed 2020·Granted Jun 14, 2022·1 cites·20 claims
- 1785US2023326711A1System and method for generating and analyzing roughness measurementsFRACTILIA LLC·Filed 2023·Application pending·0 cites
- 1881US2024312757A1System and method for generating and analyzing roughness measurements and their use for process monitoring and controlFRACTILIA LLC·Filed 2024·Application pending·0 cites
- 1977US11664188B2Edge detection systemFRACTILIA LLC·Filed 2021·Granted May 30, 2023·0 cites·24 claims
- 2067US2025069843A1Detection of Probabilistic Process WindowsFRACTILIA LLC·Filed 2024·Application pending·0 cites
- 2166US11508546B2System and method for low-noise edge detection and its use for process monitoring and controlFRACTILIA LLC·Filed 2021·Granted Nov 22, 2022·0 cites·20 claims
- 2265US11521825B2System and method for predicting stochastic-aware process window and yield and their use for process monitoring and controlFRACTILIA LLC·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 2361US2024258066A1Method of Dispositioning and Control of a Semiconductor Manufacturing ProcessFRACTILIA LLC·Filed 2024·Application pending·0 cites
- 2460US12142454B2Detection of probabilistic process windowsFRACTILIA LLC·Filed 2021·Granted Nov 12, 2024·0 cites·18 claims
- 2558US2023134093A1System and method for determining and/or predicting unbiased parameters associated with semiconductor measurementsFRACTILIA LLC·Filed 2022·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →