Assignee

FUKUDA KEIKO

JP·1 granted patent·1 pending application·1 citations·filing 2004–2009

Technology mixG01R1 G05F1 G11C1

Top patents by PatentIndex Score

2 records

0143US8145963B2Semiconductor integrated circuit device and delay fault testing method thereofFUKUDA KEIKO·Filed 2009·Granted Mar 27, 2012·1 cites·17 claims
0226US2007164809A1Voltage generation circuit and semiconductor integrated circuit deviceFUKUDA KEIKO·Filed 2004·Application pending·0 cites

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