Assignee
INTERCONNECT DEVICES INC
US·21 granted patents·1 pending application·674 citations·filing 1986–2014
Top patents by PatentIndex Score
22 records- 0194US7154286B1Dual tapered spring probeINTERCONNECT DEVICES INC·Filed 2005·Granted Dec 26, 2006·47 cites·6 claims
- 0292US6696850B1Contact probe with off-centered back-drilled apertureINTERCONNECT DEVICES INC·Filed 2002·Granted Feb 24, 2004·55 cites·18 claims
- 0388US6506082B1Electrical contact interfaceINTERCONNECT DEVICES INC·Filed 2001·Granted Jan 14, 2003·79 cites·9 claims
- 0488US5204615AModule attachment for printed circuit board test fixturesINTERCONNECT DEVICES INC·Filed 1991·Granted Apr 20, 1993·89 cites·15 claims
- 0585US7298153B2Eccentric offset Kelvin probeINTERCONNECT DEVICES INC·Filed 2005·Granted Nov 20, 2007·15 cites·4 claims
- 0685US5175493AShielded electrical contact spring probe assemblyINTERCONNECT DEVICES INC·Filed 1991·Granted Dec 29, 1992·77 cites·22 claims
- 0784US5009613ASpring contact twister probe for testing electrical printed circuit boardsINTERCONNECT DEVICES INC·Filed 1990·Granted Apr 23, 1991·62 cites·12 claims
- 0884US4783624AContact probe devices and methodINTERCONNECT DEVICES INC·Filed 1986·Granted Nov 8, 1988·99 cites·4 claims
- 0983US7362118B2Probe with contact ringINTERCONNECT DEVICES INC·Filed 2006·Granted Apr 22, 2008·12 cites·12 claims
- 1079US7148713B1Algoristic spring as probeINTERCONNECT DEVICES INC·Filed 2005·Granted Dec 12, 2006·14 cites·12 claims
- 1176US7728611B1Compressive conductors for semiconductor testingINTERCONNECT DEVICES INC·Filed 2007·Granted Jun 1, 2010·9 cites·4 claims
- 1274US7798867B2Environmentally sealed contactINTERCONNECT DEVICES INC·Filed 2008·Granted Sep 21, 2010·13 cites·11 claims
- 1372US9209548B2Electrical probe with rotatable plungerINTERCONNECT DEVICES INC·Filed 2014·Granted Dec 8, 2015·3 cites·25 claims
- 1468US7581962B2Adjustable test socketINTERCONNECT DEVICES INC·Filed 2007·Granted Sep 1, 2009·5 cites·4 claims
- 1565US6104205AProbe with tab retainerINTERCONNECT DEVICES INC·Filed 1998·Granted Aug 15, 2000·31 cites·11 claims
- 1665US5225773ASwitch probeINTERCONNECT DEVICES INC·Filed 1992·Granted Jul 6, 1993·28 cites·5 claims
- 1764US7701200B1Active test socketINTERCONNECT DEVICES INC·Filed 2007·Granted Apr 20, 2010·6 cites·14 claims
- 1851US5484306AQuick-connect terminal and receptacleINTERCONNECT DEVICES INC·Filed 1994·Granted Jan 16, 1996·20 cites·3 claims
- 1950US9437954B2Series connectorINTERCONNECT DEVICES INC·Filed 2013·Granted Sep 6, 2016·2 cites·17 claims
- 2049US7498826B2Probe array waferINTERCONNECT DEVICES INC·Filed 2006·Granted Mar 3, 2009·1 cites·18 claims
- 2144US2009289647A1Interconnect systemINTERCONNECT DEVICES INC·Filed 2009·Application pending·0 cites
- 2234US4846739AGas impervious crimp connectionINTERCONNECT DEVICES INC·Filed 1987·Granted Jul 11, 1989·7 cites·7 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →