Assignee
IZUHA KYOKO
JP·11 granted patents·2 pending applications·41 citations·filing 2008–2012
Top patents by PatentIndex Score
13 records- 0191US9177984B2Solid-state imaging device and electronic apparatus having a solid-state imaging deviceIZUHA KYOKO·Filed 2012·Granted Nov 3, 2015·8 cites·21 claims
- 0289US8558158B2Solid-state imaging device, manufacturing method and designing method thereof, and electronic deviceIZUHA KYOKO·Filed 2010·Granted Oct 15, 2013·6 cites·15 claims
- 0385US8847135B2Solid-state imaging device, driving method thereof and electronic apparatusIZUHA KYOKO·Filed 2011·Granted Sep 30, 2014·5 cites·7 claims
- 0485US8078996B2Method and system for correcting a mask pattern designIZUHA KYOKO·Filed 2009·Granted Dec 13, 2011·6 cites·7 claims
- 0583US8185856B2Manufacturing method, manufacturing program and manufacturing system for adjusting signal delay in a semiconductor deviceIZUHA KYOKO·Filed 2009·Granted May 22, 2012·11 cites·14 claims
- 0677US8605175B2Solid-state image capturing device including a photochromic film having a variable light transmittance, and electronic device including the solid-state image capturing deviceIZUHA KYOKO·Filed 2011·Granted Dec 10, 2013·1 cites·14 claims
- 0765US8490031B2Method, apparatus and program for adjusting feature dimensions to compensate for planarizing effects in the generation of mask data and manufacturing semiconductor deviceIZUHA KYOKO·Filed 2010·Granted Jul 16, 2013·2 cites·12 claims
- 0862US8112724B2Method of designing semiconductor integrated circuit, apparatus for designing semiconductor integrated circuit, recording medium, and mask manufacturing methodIZUHA KYOKO·Filed 2008·Granted Feb 7, 2012·2 cites·33 claims
- 0954US2012054695A1Pattern Verification Method, Pattern Verification System, Mask Manufacturing Method and Semiconductor Device Manufacturing MethodIZUHA KYOKO·Filed 2011·Application pending·0 cites
- 1052US8754968B2Solid-state imaging device and electronic equipmentIZUHA KYOKO·Filed 2011·Granted Jun 17, 2014·0 cites·20 claims
- 1149US8839158B2Pattern designing method, pattern designing program and pattern designing apparatusIZUHA KYOKO·Filed 2011·Granted Sep 16, 2014·0 cites·4 claims
- 1246US2009291512A1Semiconductor device pattern verification method, semiconductor device pattern verification program, and semiconductor device manufacturing methodIZUHA KYOKO·Filed 2009·Application pending·0 cites
- 1338US10163776B2Designing method of capacitive element in multilayer wirings for integrated circuit devices based on statistical processIZUHA KYOKO·Filed 2010·Granted Dec 25, 2018·0 cites·17 claims
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