Assignee
LEENO IND INC
KR·24 granted patents·7 pending applications·19 citations·filing 2000–2024
Top patents by PatentIndex Score
31 records- 0183US11639945B2Test probe assembly and test socketLEENO IND INC·Filed 2020·Granted May 2, 2023·2 cites·10 claims
- 0273US11022626B2Testing deviceLEENO IND INC·Filed 2019·Granted Jun 1, 2021·1 cites·7 claims
- 0372US12105133B2Method for fabricating test socketLEENO IND INC·Filed 2021·Granted Oct 1, 2024·1 cites·18 claims
- 0471US10670628B2Test probe and test device using the sameLEENO IND INC·Filed 2018·Granted Jun 2, 2020·1 cites·5 claims
- 0570US11408914B2MEMS probe and test device using the sameLEENO IND INC·Filed 2018·Granted Aug 9, 2022·1 cites·5 claims
- 0670US2024248118A1Test socket and method for fabricating the sameLEENO IND INC·Filed 2024·Application pending·0 cites
- 0768US10884047B2Probe socketLEENO IND INC·Filed 2018·Granted Jan 5, 2021·1 cites·5 claims
- 0860US11726111B2Test deviceLEENO IND INC·Filed 2022·Granted Aug 15, 2023·0 cites·4 claims
- 0960US2025219307A1Method for manufacturing contact tip and electroconductive pin having contact tipLEENO IND INC·Filed 2024·Application pending·0 cites
- 1059US11892472B2Test deviceLEENO IND INC·Filed 2020·Granted Feb 6, 2024·0 cites·16 claims
- 1158US2022413008A1Test socket and method for fabricating the sameLEENO IND INC·Filed 2021·Application pending·0 cites
- 1256US12320827B2Test socket and method of fabricating the sameLEENO IND INC·Filed 2021·Granted Jun 3, 2025·0 cites·6 claims
- 1355US11391757B2Test deviceLEENO IND INC·Filed 2020·Granted Jul 19, 2022·0 cites·3 claims
- 1454US10884024B2Test socket unitLEENO IND INC·Filed 2018·Granted Jan 5, 2021·1 cites·6 claims
- 1553US12474373B2Test socket including probes formed of elastic material containing conductive particles and method of manufacturing the sameLEENO IND INC·Filed 2021·Granted Nov 18, 2025·0 cites·7 claims
- 1653US12105138B2Test socketLEENO IND INC·Filed 2021·Granted Oct 1, 2024·0 cites·9 claims
- 1750US11609245B2Test deviceLEENO IND INC·Filed 2019·Granted Mar 21, 2023·0 cites·7 claims
- 1847US11150270B2Test deviceLEENO IND INC·Filed 2020·Granted Oct 19, 2021·0 cites·6 claims
- 1943US11333680B2Probe socketLEENO IND INC·Filed 2019·Granted May 17, 2022·0 cites·4 claims
- 2042US6350153B1Electrical connector for connecting an integrated circuit to a printed circuit boardLEENO IND INC·Filed 2000·Granted Feb 26, 2002·4 cites·5 claims
- 2141US12320833B2Method for fabricating test socketLEENO IND INC·Filed 2021·Granted Jun 3, 2025·0 cites·15 claims
- 2240US10656180B2Test deviceLEENO IND INC·Filed 2018·Granted May 19, 2020·0 cites·4 claims
- 2340US6836129B2Air interface apparatus for use in high-frequency probe deviceLEENO IND INC·Filed 2003·Granted Dec 28, 2004·7 cites·10 claims
- 2439US10976348B2Test socket assemblyLEENO IND INC·Filed 2018·Granted Apr 13, 2021·0 cites·4 claims
- 2539US2015123687A1Test probe and machining method thereofLEENO IND INC·Filed 2013·Application pending·0 cites
- 2638US2008036484A1Test probe and manufacturing method thereofLEENO IND INC·Filed 2007·Application pending·0 cites
- 2736US2008180125A1Contact Probe And Socket For Testing Semiconductor ChipsLEENO IND INC·Filed 2007·Application pending·0 cites
- 2829USD1115567SBarrel for a test probeLEENO IND INC·Filed 2024·Granted Mar 3, 2026·0 cites·1 claims
- 2929US10302674B2Test deviceLEENO IND INC·Filed 2017·Granted May 28, 2019·0 cites·7 claims
- 3025US10338100B2Test socketLEENO IND INC·Filed 2017·Granted Jul 2, 2019·0 cites·14 claims
- 3121US2006152240A1Probe device with micro-pin inserted in interface boardLEENO IND INC·Filed 2006·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →