Test socket and method of fabricating the same

Abstract

A test socket includes a socket block of an insulating material, provided with a probe hole to accommodate the probe, and a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole, at least a portion of the internal film being electrically isolated from the external film.

The invention claimed is: 
     
       1. A test socket supporting a probe, comprising:
 a socket block of an insulating material, provided with a probe hole to accommodate the probe; and 
 a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole, 
 wherein at least a portion of the internal film is electrically isolated from the external film at a portion of the inner surface of the probe hole. 
 
     
     
       2. The test socket according to  claim 1 , wherein
 the probe hole comprises an accommodating portion to accommodate the probe and first and second supporting portions to respectively support opposite end portions of the probe, and 
 the at least a portion of the internal film comprises a portion to cover the first and second supporting portions. 
 
     
     
       3. The test socket according to  claim 1 , wherein the probe comprises a power probe to apply power, and a signal probe to apply a test signal. 
     
     
       4. A method of fabricating a test socket supporting a probe, the method comprising:
 preparing a socket block of an insulating material; 
 forming a probe hole, in which the probe is inserted, in the socket block; 
 forming a coating portion comprising an external film and an internal film by coating an outer surface of the socket block and an inner surface of the probe hole with a conductive material; and 
 electrically isolating at least a portion of the internal film from the external film by removing a portion of the internal film at the inner surface of the probe hole. 
 
     
     
       5. The method according to  claim 4 , wherein the at least a portion of the internal film comprises portions to which opposite end portions of the probe are supported. 
     
     
       6. The method according to  claim 4 , wherein
 the probe hole comprises an accommodating portion having a larger diameter than the probe, and first and second supporting portions to respectively support the opposite end portions of the probe, and 
 the isolating comprises removing an external film surrounding opposite outlets of the probe hole, a boundary portion between a first end of the accommodating portion and the first supporting portion, and a boundary portion between a second end of the accommodating portion and the second supporting portion.