Assignee
LIN WEI-CHUAN
CN·1 granted patent·1 pending application·6 citations·filing 2009–2011
Top patents by PatentIndex Score
2 records- 0166US8159627B2Pixel layout structure for raising capability of detecting amorphous silicon residue defects and method for manufacturing the sameLIN WEI-CHUAN·Filed 2009·Granted Apr 17, 2012·6 cites·8 claims
- 0232US2011230009A1Pixel layout structure for raising capability of detecting amorphous silicon residue defects and method for manufacturing the sameLIN WEI-CHUAN·Filed 2011·Application pending·0 cites
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