Assignee
MIE FUJITSU SEMICONDUCTOR LTD
JP·72 granted patents·6 pending applications·258 citations·filing 2012–2018
Top patents by PatentIndex Score
78 records- 0197US9070477B1Bit interleaved low voltage static random access memory (SRAM) and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Jun 30, 2015·32 cites·20 claims
- 0296US9112484B1Integrated circuit process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 18, 2015·25 cites·16 claims
- 0395US9299801B1Method for fabricating a transistor device with a tuned dopant profileMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Mar 29, 2016·21 cites·14 claims
- 0495US9117746B1Porting a circuit design from a first semiconductor process to a second semiconductor processMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Aug 25, 2015·16 cites·18 claims
- 0593US9112057B1Semiconductor devices with dopant migration suppression and method of fabrication thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2012·Granted Aug 18, 2015·17 cites·19 claims
- 0693US9093550B1Integrated circuits having a plurality of high-K metal gate FETs with various combinations of channel foundation structure and gate stack structure and methods of making sameMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Jul 28, 2015·20 cites·9 claims
- 0792US9478571B1Buried channel deeply depleted channel transistorMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Oct 25, 2016·10 cites·9 claims
- 0890US9922977B2Transistor with threshold voltage set notch and method of fabrication thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Mar 20, 2018·6 cites·7 claims
- 0989US9299698B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Mar 29, 2016·7 cites·9 claims
- 1089US9196727B2High uniformity screen and epitaxial layers for CMOS devicesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Nov 24, 2015·8 cites·7 claims
- 1188US9496261B2Low power semiconductor transistor structure and method of fabrication thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Nov 15, 2016·10 cites·13 claims
- 1288US9112495B1Integrated circuit device body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 18, 2015·9 cites·21 claims
- 1386US10217668B2Electronic devices and systems, and methods for making and using the sameMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Feb 26, 2019·2 cites·6 claims
- 1486US9111785B2Semiconductor structure with improved channel stack and method for fabrication thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 18, 2015·7 cites·12 claims
- 1585US9953974B2Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Apr 24, 2018·3 cites·12 claims
- 1685US9710006B2Power up body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Jul 18, 2017·7 cites·19 claims
- 1785US9583484B2Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Feb 28, 2017·3 cites·11 claims
- 1884US10074568B2Electronic devices and systems, and methods for making and using sameMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Sep 11, 2018·2 cites·8 claims
- 1984US9236466B1Analog circuits having improved insulated gate transistors, and methods thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2012·Granted Jan 12, 2016·8 cites·23 claims
- 2083US9368624B2Method for fabricating a transistor with reduced junction leakage currentMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Jun 14, 2016·3 cites·1 claims
- 2182US9093997B1Slew based process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Jul 28, 2015·4 cites·15 claims
- 2281US9577041B2Method for fabricating a transistor device with a tuned dopant profileMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Feb 21, 2017·2 cites·4 claims
- 2380US9786703B2Buried channel deeply depleted channel transistorMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Oct 10, 2017·2 cites·7 claims
- 2479US9865596B2Low power semiconductor transistor structure and method of fabrication thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Jan 9, 2018·2 cites·14 claims
- 2579US9431068B2Dynamic random access memory (DRAM) with low variation transistor peripheral circuitsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 30, 2016·5 cites·3 claims
- 2679US9268885B1Integrated circuit device methods and models with predicted device metric variationsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Feb 23, 2016·5 cites·12 claims
- 2778US9853019B2Integrated circuit device body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Dec 26, 2017·2 cites·3 claims
- 2877US9319034B2Slew based process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Apr 19, 2016·2 cites·13 claims
- 2974US9297850B1Circuits and methods for measuring circuit elements in an integrated circuit deviceMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Mar 29, 2016·3 cites·17 claims
- 3073US10249637B2Manufacturing method of semiconductor deviceMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Apr 2, 2019·2 cites·11 claims
- 3173US10014363B2Semiconductor device having resistance elements and fabrication method thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Jul 3, 2018·1 cites·9 claims
- 3273US9424385B1SRAM cell layout structure and devices therefromMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Aug 23, 2016·3 cites·17 claims
- 3368US9362291B1Integrated circuit devices and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Jun 7, 2016·2 cites·19 claims
- 3468US9276561B2Integrated circuit process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Mar 1, 2016·1 cites·2 claims
- 3567US9838012B2Digital circuits having improved transistors, and methods thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Dec 5, 2017·1 cites·6 claims
- 3667US9391076B1CMOS structures and processes based on selective thinningMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Jul 12, 2016·1 cites·7 claims
- 3765US9281248B1CMOS gate stack structures and processesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Mar 8, 2016·1 cites·25 claims
- 3864US10224244B2Electronic devices and systems, and methods for making and using the sameMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Mar 5, 2019·0 cites·12 claims
- 3964US9741428B2Integrated circuit devices and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Aug 22, 2017·1 cites·1 claims
- 4062US10217838B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Feb 26, 2019·0 cites·9 claims
- 4160US10250257B2Digital circuits having improved transistors, and methods thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Apr 2, 2019·0 cites·1 claims
- 4259US10510824B2Semiconductor device having resistance elements and fabrication method thereofMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Dec 17, 2019·0 cites·10 claims
- 4359US10354953B2Semiconductor deviceMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Jul 16, 2019·0 cites·10 claims
- 4459US9966130B2Integrated circuit devices and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted May 8, 2018·0 cites·10 claims
- 4559US9812550B2Semiconductor structure with multiple transistors having various threshold voltagesMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Nov 7, 2017·0 cites·1 claims
- 4659US9154123B1Body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Oct 6, 2015·1 cites·16 claims
- 4758US10573644B2Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Feb 25, 2020·0 cites·12 claims
- 4858US9985631B2Digital circuits having improved transistors, and methods thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted May 29, 2018·0 cites·1 claims
- 4958US9793172B2Reducing or eliminating pre-amorphization in transistor manufactureMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Oct 17, 2017·0 cites·6 claims
- 5057US10325986B2Advanced transistors with punch through suppressionMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Jun 18, 2019·0 cites·8 claims
Showing the top 50 of 78 patent records by PatentIndex Score.
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