Assignee
NIHON MICRONICS KK
JP·191 granted patents·57 pending applications·844 citations·filing 1997–2025
Top patents by PatentIndex Score
248 records- 0194US10859599B2Electrical connection apparatusNIHON MICRONICS KK·Filed 2018·Granted Dec 8, 2020·8 cites·4 claims
- 0294US6019612AElectrical connecting apparatus for electrically connecting a device to be testedNIHON MICRONICS KK·Filed 1998·Granted Feb 1, 2000·127 cites·13 claims
- 0393US7946855B2Contact and electrical connecting apparatusNIHON MICRONICS KK·Filed 2009·Granted May 24, 2011·33 cites·8 claims
- 0492US7629807B2Electrical test probeNIHON MICRONICS KK·Filed 2005·Granted Dec 8, 2009·31 cites·9 claims
- 0592US5888075AAuxiliary apparatus for testing deviceNIHON MICRONICS KK·Filed 1997·Granted Mar 30, 1999·87 cites·18 claims
- 0691US7586321B2Electrical test probe and electrical test probe assemblyNIHON MICRONICS KK·Filed 2007·Granted Sep 8, 2009·19 cites·10 claims
- 0790US11971431B2Optical probe, optical probe array, optical probe card, and method of manufacturing optical probeNIHON MICRONICS KK·Filed 2021·Granted Apr 30, 2024·2 cites·9 claims
- 0890US11971296B2Measurement system and measurement methodNIHON MICRONICS KK·Filed 2021·Granted Apr 30, 2024·2 cites·15 claims
- 0990US7458818B2Electric connector and electrical connecting apparatus using the sameNIHON MICRONICS KK·Filed 2007·Granted Dec 2, 2008·27 cites·12 claims
- 1089US11762008B2Connecting device for inspectionNIHON MICRONICS KK·Filed 2020·Granted Sep 19, 2023·2 cites·9 claims
- 1188US11624679B2Optical probe, optical probe array, test system and test methodNIHON MICRONICS KK·Filed 2020·Granted Apr 11, 2023·2 cites·9 claims
- 1288US10775411B2Probe card and contact inspection deviceNIHON MICRONICS KK·Filed 2016·Granted Sep 15, 2020·5 cites·12 claims
- 1388US10215801B2Contact inspection device having a probe head and rotation restricting portionsNIHON MICRONICS KK·Filed 2015·Granted Feb 26, 2019·4 cites·23 claims
- 1487US7888958B2Current test probe having a solder guide portion, and related probe assembly and production methodNIHON MICRONICS KK·Filed 2006·Granted Feb 15, 2011·20 cites·13 claims
- 1587US7377788B2Electrical connecting apparatus and contactNIHON MICRONICS KK·Filed 2006·Granted May 27, 2008·16 cites·8 claims
- 1686US11860190B2Probe unit with a free length cantilever contactor and pedestalNIHON MICRONICS KK·Filed 2022·Granted Jan 2, 2024·1 cites·12 claims
- 1786US10024908B2Probe and contact inspection deviceNIHON MICRONICS KK·Filed 2015·Granted Jul 17, 2018·5 cites·15 claims
- 1885US2026056233A1Probe and electrical connection deviceNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 1984US10969442B2Test systemNIHON MICRONICS KK·Filed 2018·Granted Apr 6, 2021·2 cites·11 claims
- 2084US7934945B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted May 3, 2011·10 cites·9 claims
- 2184US7819672B2Electrical connecting apparatus with inclined probe recess surfacesNIHON MICRONICS KK·Filed 2007·Granted Oct 26, 2010·11 cites·7 claims
- 2283US10768207B2Electrical connection deviceNIHON MICRONICS KK·Filed 2018·Granted Sep 8, 2020·2 cites·7 claims
- 2383US7800001B2Probe sheet and electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted Sep 21, 2010·14 cites·6 claims
- 2482US12031921B2Measurement systemNIHON MICRONICS KK·Filed 2020·Granted Jul 9, 2024·1 cites·4 claims
- 2582US11482805B2Electrical contactor, electrical connecting structure and electrical connecting apparatusNIHON MICRONICS KK·Filed 2020·Granted Oct 25, 2022·2 cites·13 claims
- 2682US11150268B2Electric connection deviceNIHON MICRONICS KK·Filed 2018·Granted Oct 19, 2021·2 cites·6 claims
- 2782US7791364B2Electronic device probe card with improved probe groupingNIHON MICRONICS KK·Filed 2008·Granted Sep 7, 2010·8 cites·7 claims
- 2881US11022627B2Probe and electric connecting apparatusNIHON MICRONICS KK·Filed 2018·Granted Jun 1, 2021·2 cites·13 claims
- 2981US7586316B2Probe board mounting apparatusNIHON MICRONICS KK·Filed 2008·Granted Sep 8, 2009·12 cites·8 claims
- 3081US7303404B2Contact and electrical connecting apparatusNIHON MICRONICS KK·Filed 2006·Granted Dec 4, 2007·13 cites·11 claims
- 3180US9400309B2Electric connecting apparatusNIHON MICRONICS KK·Filed 2014·Granted Jul 26, 2016·4 cites·7 claims
- 3280US7474111B2Electrical probe assembly with guard members for the probesNIHON MICRONICS KK·Filed 2007·Granted Jan 6, 2009·10 cites·8 claims
- 3380US2026079179A1ProbeNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 3479US9583857B2Electrical contactor and electrical connecting apparatusNIHON MICRONICS KK·Filed 2015·Granted Feb 28, 2017·4 cites·5 claims
- 3579US7934944B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted May 3, 2011·8 cites·9 claims
- 3679US7471095B2Electrical connecting apparatus and method for use thereofNIHON MICRONICS KK·Filed 2007·Granted Dec 30, 2008·9 cites·6 claims
- 3779US2026029428A1Probe and method for manufacturing electrical connection deviceNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 3878US2026029427A1Manufacturing jig for electrical connection device and method of manufacturing electrical connection deviceNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 3977US9194886B2Probe and probe cardNIHON MICRONICS KK·Filed 2013·Granted Nov 24, 2015·3 cites·8 claims
- 4077US7771220B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2009·Granted Aug 10, 2010·6 cites·12 claims
- 4177US2026016524A1Inspection apparatusNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 4277US2026016532A1Inspection apparatusNIHON MICRONICS KK·Filed 2025·Application pending·0 cites
- 4376US11099227B2Multilayer wiring base plate and probe card using the sameNIHON MICRONICS KK·Filed 2017·Granted Aug 24, 2021·2 cites·12 claims
- 4476US9207260B2Probe block, probe card and probe apparatus both having the probe blockNIHON MICRONICS KK·Filed 2012·Granted Dec 8, 2015·4 cites·14 claims
- 4576US7898339B2Amplifier circuitNIHON MICRONICS KK·Filed 2009·Granted Mar 1, 2011·10 cites·7 claims
- 4676US7468610B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2007·Granted Dec 23, 2008·9 cites·6 claims
- 4775US11209460B2Electrical connection device with a short-circuit wiring pattern that reduces connection wiringsNIHON MICRONICS KK·Filed 2018·Granted Dec 28, 2021·1 cites·8 claims
- 4875US9069008B2Inspection apparatus for semiconductor devices and chuck stage for the inspection apparatus that is movable with respect to the front and back side electrodesNIHON MICRONICS KK·Filed 2012·Granted Jun 30, 2015·5 cites·9 claims
- 4975US7862733B2Method for manufacturing a probeNIHON MICRONICS KK·Filed 2007·Granted Jan 4, 2011·5 cites·10 claims
- 5075US7619425B2Electrical connecting apparatusNIHON MICRONICS KK·Filed 2005·Granted Nov 17, 2009·8 cites·10 claims
Showing the top 50 of 248 patent records by PatentIndex Score.
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