Assignee
OHTSUKA KENICHI
JP·7 granted patents·1 pending application·16 citations·filing 2007–2012
Top patents by PatentIndex Score
8 records- 0177US8885173B2Film thickness measurement device and film thickness measurement methodOHTSUKA KENICHI·Filed 2010·Granted Nov 11, 2014·6 cites·10 claims
- 0275US8699023B2Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring methodOHTSUKA KENICHI·Filed 2011·Granted Apr 15, 2014·3 cites·10 claims
- 0367US9059193B2Epitaxial wafer and semiconductor elementOHTSUKA KENICHI·Filed 2010·Granted Jun 16, 2015·2 cites·4 claims
- 0467US8093598B2Power semiconductor deviceOHTSUKA KENICHI·Filed 2007·Granted Jan 10, 2012·2 cites·7 claims
- 0565US8916880B2Silicon carbide epitaxial wafer and semiconductor deviceOHTSUKA KENICHI·Filed 2011·Granted Dec 23, 2014·2 cites·6 claims
- 0655US8649023B2Film thickness measurement device and measurement methodOHTSUKA KENICHI·Filed 2010·Granted Feb 11, 2014·1 cites·12 claims
- 0748US2012074508A1Power semiconductor deviceOHTSUKA KENICHI·Filed 2011·Application pending·0 cites
- 0842US9153443B2Semiconductor device and method of fabricating sameOHTSUKA KENICHI·Filed 2012·Granted Oct 6, 2015·0 cites·16 claims
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