Assignee
PATTERSON OLIVER D
US·4 granted patents·1 pending application·70 citations·filing 2004–2012
Top patents by PatentIndex Score
5 records- 0195US8750597B2Robust inspection alignment of semiconductor inspection tools using design informationPATTERSON OLIVER D·Filed 2011·Granted Jun 10, 2014·65 cites·16 claims
- 0267US8841933B2Inspection tool and methodology for three dimensional voltage contrast inspectionPATTERSON OLIVER D·Filed 2010·Granted Sep 23, 2014·2 cites·12 claims
- 0367US8787074B2Static random access memory test structurePATTERSON OLIVER D·Filed 2011·Granted Jul 22, 2014·2 cites·20 claims
- 0462US9291665B2Evaluating transistors with e-beam inspectionPATTERSON OLIVER D·Filed 2012·Granted Mar 22, 2016·1 cites·21 claims
- 0536US2005255611A1Defect identification system and method for repairing killer defects in semiconductor devicesPATTERSON OLIVER D·Filed 2004·Application pending·0 cites
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