Assignee
QUALITAU INC
US·31 granted patents·2 pending applications·248 citations·filing 1997–2021
Top patents by PatentIndex Score
33 records- 0191US7126361B1Vertical probe card and air cooled probe head systemQUALITAU INC·Filed 2005·Granted Oct 24, 2006·32 cites·23 claims
- 0287US6798228B2Test socket for packaged semiconductor devicesQUALITAU INC·Filed 2003·Granted Sep 28, 2004·38 cites·8 claims
- 0386US11054444B2System and method for limiting voltageQUALITAU INC·Filed 2017·Granted Jul 6, 2021·3 cites·17 claims
- 0486US10690715B2Signal distribution apparatusQUALITAU INC·Filed 2018·Granted Jun 23, 2020·3 cites·13 claims
- 0586US7602201B2High temperature ceramic socket configured to test packaged semiconductor devicesQUALITAU INC·Filed 2007·Granted Oct 13, 2009·18 cites·11 claims
- 0675US7098648B2Automatic range finder for electric current testingQUALITAU INC·Filed 2004·Granted Aug 29, 2006·20 cites·9 claims
- 0774US7888951B2Integrated unit for electrical/reliability testing with improved thermal controlQUALITAU INC·Filed 2009·Granted Feb 15, 2011·7 cites·20 claims
- 0868US7172450B1High temperature open ended zero insertion force (ZIF) test socketQUALITAU INC·Filed 2006·Granted Feb 6, 2007·11 cites·13 claims
- 0967US12135335B2Semi-automatic proberQUALITAU INC·Filed 2021·Granted Nov 5, 2024·0 cites·20 claims
- 1066US11175309B2Semi-automatic proberQUALITAU INC·Filed 2015·Granted Nov 16, 2021·1 cites·15 claims
- 1166US9196516B2Wafer temperature measurement toolQUALITAU INC·Filed 2013·Granted Nov 24, 2015·2 cites·19 claims
- 1265US7598760B1High temperature ceramic die package and DUT board socketQUALITAU INC·Filed 2008·Granted Oct 6, 2009·3 cites·8 claims
- 1365US7151389B2Dual channel source measurement unit for semiconductor device testingQUALITAU INC·Filed 2005·Granted Dec 19, 2006·6 cites·8 claims
- 1461US7511517B2Semi-automatic multiplexing system for automated semiconductor wafer testingQUALITAU INC·Filed 2005·Granted Mar 31, 2009·1 cites·8 claims
- 1559US7576550B2Automatic multiplexing system for automated wafer testingQUALITAU INC·Filed 2007·Granted Aug 18, 2009·3 cites·8 claims
- 1659US6011405AApparatus and method for probing multiple integrated circuit dice in a semiconductor waferQUALITAU INC·Filed 1997·Granted Jan 4, 2000·23 cites·7 claims
- 1758US7082676B2Electrostatic discharge (ESD) tool for electronic device under test (DUT) boardsQUALITAU INC·Filed 2003·Granted Aug 1, 2006·12 cites·18 claims
- 1858US6784000B2Method for measurement of electromigration in semiconductor integrated circuitsQUALITAU INC·Filed 2001·Granted Aug 31, 2004·10 cites·3 claims
- 1954US7602205B2Electromigration tester for high capacity and high currentQUALITAU INC·Filed 2008·Granted Oct 13, 2009·2 cites·8 claims
- 2053US6249137B1Circuit and method for pulsed reliability testingQUALITAU INC·Filed 1999·Granted Jun 19, 2001·20 cites·15 claims
- 2150US7812589B2Modified current source (MCS) with seamless range switchingQUALITAU INC·Filed 2008·Granted Oct 12, 2010·2 cites·9 claims
- 2250US7405573B2Electrical connector for semiconductor device test fixture and test assemblyQUALITAU INC·Filed 2005·Granted Jul 29, 2008·3 cites·10 claims
- 2349US7429856B1Voltage source measurement unit with minimized common mode errorsQUALITAU INC·Filed 2007·Granted Sep 30, 2008·1 cites·14 claims
- 2445US7049713B2Pulsed current generator circuit with charge boosterQUALITAU INC·Filed 2003·Granted May 23, 2006·3 cites·9 claims
- 2540US6565373B2ZIF socket and actuator for DIPQUALITAU INC·Filed 2002·Granted May 20, 2003·1 cites·11 claims
- 2640US2008315862A1Smart parallel controller for semiconductor experimentsQUALITAU INC·Filed 2007·Application pending·0 cites
- 2739US6469494B1Programmable connectorQUALITAU INC·Filed 1999·Granted Oct 22, 2002·8 cites·19 claims
- 2838US6179640B1High temperature minimal (zero) insertion force socketQUALITAU INC·Filed 1999·Granted Jan 30, 2001·9 cites·11 claims
- 2938US6150829AThree-dimensional programmable connectorQUALITAU INC·Filed 1999·Granted Nov 21, 2000·6 cites·10 claims
- 3037US10890602B2Universal probing assembly with five degrees of freedomQUALITAU INC·Filed 2017·Granted Jan 12, 2021·0 cites·18 claims
- 3137US9772351B2Pulsed current source with internal impedance matchingQUALITAU INC·Filed 2016·Granted Sep 26, 2017·0 cites·16 claims
- 3236US6592389B2High-temperature minimal (zero) insertion force socketQUALITAU INC·Filed 2002·Granted Jul 15, 2003·0 cites·11 claims
- 3334US2017131326A1Pulsed current source with internal impedance matchingQUALITAU INC·Filed 2015·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →