High temperature open ended zero insertion force (ZIF) test socket

Abstract

A socket for use in testing packaged integrated circuits having leads depending therefrom includes a first member for receiving the integrated circuit package and having a plurality of holes for receiving leads extending from the package. A second member has a plurality of wire contacts for engaging the leads, the first and second members being arranged to permit relative lateral translation thereof. A support frame includes a first portion which physically engages the first member and a second portion which physically engages the second member. A lever or handle is attached to the second portion and includes a cam surface for engaging a cam follower on the first portion for imparting relative lateral motion between the two members whereby the package leads physically engage wires of the second member.

1. A socket for use in testing a packaged integrated circuit device having a plurality of leads extending therefrom, said socket comprising:
 a) a first member for receiving an integrated circuit package and having a plurality of holes for receiving leads extending from the package, 
 b) a second member having a plurality of wire contacts for engaging the leads, the first and second members being arranged to permit relative lateral translation thereof, 
 c) a support frame for the first and second members and including guides for permitting relative lateral motion between the first and second members from a device load/unload position where device leads do not engage the wires to a device test position where device leads engage the wires, the support frame further including a first portion physically engaging the first member, a second portion physically engaging the second member, the lever being pivotally attached to one portion of the first portion and second portion and contacting the other portion to impart the relative lateral motion between the first member and the second member, and 
 d) a lateral translation lever pivotally attached to the support frame for imparting relative lateral motion between the first and second members. 
 
   
   
     2. The socket as defined by  claim 1  wherein the one portion is the second portion. 
   
   
     3. The socket as defined by  claim 2  wherein the first portion of the frame includes two rails, to which the first member is attached, the rails defining guides for slidably receiving the second member. 
   
   
     4. The socket as defined by  claim 3  wherein the lever has cam surfaces, and the two rails have cam followers which are engaged by the cam surfaces when imparting relative lateral motion between the first member and the second member. 
   
   
     5. The socket as defined by  claim 4  wherein the first and second members are ceramic plates. 
   
   
     6. The socket as defined by  claim 5  wherein the support frame is metal. 
   
   
     7. The socket as defined by  claim 4  wherein the support frame is metal. 
   
   
     8. The socket as defined by  claim 4  and including bearings as the cam followers. 
   
   
     9. The socket as defined by  claim 4  wherein opposing ends of the socket are open to permit insertion of packages of varying length and varying number of leads. 
   
   
     10. The socket as defined by  claim 9  wherein a plurality of packaged devices can be inserted. 
   
   
     11. The socket as defined by  claim 4  and further including a spring connected between the first portion and the second portion of the support frame which urges the first portion of the frame to return to an open position when the cam follower is not engaged. 
   
   
     12. The socket as defined by  claim 1  wherein the wires of the second member are configured to electrically engage electrical leads on a printed circuit board on which the socket can be mounted. 
   
   
     13. The socket as defined by  claim 1  wherein the holes in the first member are arranged in parallel rows for receiving leads from a dual in-line integrated circuit package.