Assignee
SHANGHAI HUALI MICROELECT CORP
CN·144 granted patents·63 pending applications·184 citations·filing 2011–2025
Top patents by PatentIndex Score
207 records- 0194US10877501B1Power supply powering-on structureSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Dec 29, 2020·5 cites·15 claims
- 0293US8652931B1Method of dual-depth STI formationSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Feb 18, 2014·16 cites·13 claims
- 0392US11257557B2One-time programmable memory and an operation method thereofSHANGHAI HUALI MICROELECT CORP·Filed 2021·Granted Feb 22, 2022·4 cites·10 claims
- 0492US11205491B1Reading reference current automatic regulation circuit of non-volatile memorySHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Dec 21, 2021·3 cites·9 claims
- 0591US8865482B2Method of detecting the circular uniformity of the semiconductor circular contact holesSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Oct 21, 2014·37 cites·6 claims
- 0690US10972112B150%-duty-cycle consecutive integer frequency divider and phase-locked loop circuitSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Apr 6, 2021·6 cites·20 claims
- 0788US9331147B1Methods and systems for using conformal filling layers to improve device surface uniformitySHANGHAI HUALI MICROELECT CORP·Filed 2015·Granted May 3, 2016·6 cites·15 claims
- 0887US12292692B2Image stitching method for stitching productSHANGHAI HUALI MICROELECT CORP·Filed 2022·Granted May 6, 2025·1 cites·15 claims
- 0986US12396170B2Super flash and method for manufacturing sameSHANGHAI HUALI MICROELECT CORP·Filed 2023·Granted Aug 19, 2025·2 cites·16 claims
- 1085US11342217B1Method for improving HDP filling defects through STI etching processSHANGHAI HUALI MICROELECT CORP·Filed 2021·Granted May 24, 2022·2 cites·3 claims
- 1184US10707882B1Voltage-controlled oscillator circuit and phase-locked loop circuitSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Jul 7, 2020·3 cites·9 claims
- 1283US11374014B2Flash with shallow trench in channel region and method for manufacturing the sameSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Jun 28, 2022·2 cites·15 claims
- 1383US9449872B1Method for forming cobalt barrier layer and metal interconnection processSHANGHAI HUALI MICROELECT CORP·Filed 2015·Granted Sep 20, 2016·6 cites·14 claims
- 1483US8863045B1Optical proximity correction method based on hybrid simulation modelSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Oct 14, 2014·5 cites·6 claims
- 1582US11322506B2Semiconductor structure of split gate flash memory cell and method for manufacturing the sameSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted May 3, 2022·1 cites·12 claims
- 1681US8898598B1Layout pattern modification methodSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Nov 25, 2014·7 cites·7 claims
- 1780US12040339B2Method for manufacturing deep trench isolation grid structureSHANGHAI HUALI MICROELECT CORP·Filed 2021·Granted Jul 16, 2024·1 cites·15 claims
- 1880US9583620B2Shaped cavity for SiGe filling materialSHANGHAI HUALI MICROELECT CORP·Filed 2015·Granted Feb 28, 2017·3 cites·5 claims
- 1979US11183257B1Programmable memorySHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Nov 23, 2021·1 cites·8 claims
- 2078US9991116B1Method for forming high aspect ratio patterning structureSHANGHAI HUALI MICROELECT CORP·Filed 2016·Granted Jun 5, 2018·3 cites·10 claims
- 2178US9842743B1Method of etching a shallow trenchSHANGHAI HUALI MICROELECT CORP·Filed 2016·Granted Dec 12, 2017·3 cites·9 claims
- 2276US8569137B1Method of improving PMOS performance in a contact etch stop layer processSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Oct 29, 2013·3 cites·8 claims
- 2375US11315942B2Nonvolatile memory device having a memory-transistor gate-electrode provided with a charge-trapping gate-dielectric layer and two sidewall select-transistor gate-electrodesSHANGHAI HUALI MICROELECT CORP·Filed 2019·Granted Apr 26, 2022·2 cites·7 claims
- 2475US10700186B2Silicon-controlled rectifier structure and manufacturing method thereofSHANGHAI HUALI MICROELECT CORP·Filed 2018·Granted Jun 30, 2020·3 cites·10 claims
- 2575US10332979B2Methods and systems for reducing dislocation defects in high concentration epitaxy processesSHANGHAI HUALI MICROELECT CORP·Filed 2015·Granted Jun 25, 2019·2 cites·7 claims
- 2673US11204613B2LDO circuit device and overcurrent protection circuit thereofSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Dec 21, 2021·2 cites·16 claims
- 2773US8884288B1Semiconductor structure with means for testing metal-insulator-metal capacitorsSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Nov 11, 2014·4 cites·8 claims
- 2872US10325060B2Hotspot correction methodSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Jun 18, 2019·2 cites·10 claims
- 2972US8658531B2Method of forming connection holesSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Feb 25, 2014·4 cites·11 claims
- 3072US8659071B2Method and structure to improve the erasing speed operation of SONOS memory device having a graded silicon nitride layerSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Feb 25, 2014·4 cites·15 claims
- 3170US10380288B2Structure and generation method of clock distribution networkSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Aug 13, 2019·2 cites·4 claims
- 3270US10269893B2Method and system for MOM capacitance value controlSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Apr 23, 2019·3 cites·8 claims
- 3370US10261426B2Optimization method and system for overlay error compensationSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Apr 16, 2019·2 cites·8 claims
- 3470US10101246B2Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysisSHANGHAI HUALI MICROELECT CORP·Filed 2016·Granted Oct 16, 2018·2 cites·10 claims
- 3570US9076668B2Method of manufacturing the trench of U-shapeSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Jul 7, 2015·3 cites·9 claims
- 3669US11676987B2Semiconductor structure and the manufacturing method thereofSHANGHAI HUALI MICROELECT CORP·Filed 2022·Granted Jun 13, 2023·0 cites·14 claims
- 3769US10192861B1OPC method for a shallow ion implanting layerSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Jan 29, 2019·2 cites·10 claims
- 3868US10134900B2SiGe source/drain structure and preparation method thereofSHANGHAI HUALI MICROELECT CORP·Filed 2016·Granted Nov 20, 2018·1 cites·8 claims
- 3967US11854790B2Global shutter CMOS image sensor and method for making the sameSHANGHAI HUALI MICROELECT CORP·Filed 2022·Granted Dec 26, 2023·0 cites·8 claims
- 4067US11723197B2Semiconductor structure of split gate flash memory cellSHANGHAI HUALI MICROELECT CORP·Filed 2021·Granted Aug 8, 2023·0 cites·5 claims
- 4167US10992259B2OscillatorSHANGHAI HUALI MICROELECT CORP·Filed 2020·Granted Apr 27, 2021·1 cites·10 claims
- 4267US10192776B1Manufacturing method of a flash waferSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Jan 29, 2019·2 cites·9 claims
- 4367US10014225B1Methods for fabricating metal gate structuresSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Jul 3, 2018·1 cites·7 claims
- 4466US10651285B2Method for avoiding IL regrown in a HKMG processSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted May 12, 2020·1 cites·20 claims
- 4566US10008420B2Embedded SiGe epitaxy test padSHANGHAI HUALI MICROELECT CORP·Filed 2015·Granted Jun 26, 2018·1 cites·10 claims
- 4666US9337352B1Floating gate flash memory device and compilation method thereofSHANGHAI HUALI MICROELECT CORP·Filed 2015·Granted May 10, 2016·4 cites·18 claims
- 4763US10261410B2OPC method for a pattern cornerSHANGHAI HUALI MICROELECT CORP·Filed 2017·Granted Apr 16, 2019·1 cites·12 claims
- 4863US9171731B2Method of forming the gate with the LELE double patternSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Oct 27, 2015·2 cites·7 claims
- 4963US8822333B2Method of manufacturing a tungsten plugSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Sep 2, 2014·1 cites·10 claims
- 5063US8645879B2Algorithm of Cu interconnect dummy insertingSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Feb 4, 2014·2 cites·7 claims
Showing the top 50 of 207 patent records by PatentIndex Score.
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