Assignee
SUSS MICROTEC TEST SYS GMBH
DE·16 granted patents·13 pending applications·99 citations·filing 2004–2009
Top patents by PatentIndex Score
29 records- 0194US7332923B2Test probe for high-frequency measurementSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Feb 19, 2008·33 cites·18 claims
- 0280US7733108B2Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 8, 2010·9 cites·14 claims
- 0376US7579849B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·8 cites·11 claims
- 0476US7235990B1Probe station comprising a bellows with EMI shielding capabilitiesSUSS MICROTEC TEST SYS GMBH·Filed 2005·Granted Jun 26, 2007·9 cites·18 claims
- 0563US7859278B2Probe holder for a probe for testing semiconductor componentsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Dec 28, 2010·4 cites·15 claims
- 0663US7652491B2Probe support with shield for the examination of test substrates under use of probe supportsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jan 26, 2010·4 cites·12 claims
- 0762US7579854B2Probe station and method for measurements of semiconductor devices under defined atmosphereSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 25, 2009·4 cites·21 claims
- 0862US7057408B2Method and prober for contacting a contact area with a contact tipSUSS MICROTEC TEST SYS GMBH·Filed 2004·Granted Jun 6, 2006·11 cites·13 claims
- 0959US7741860B2Prober for testing magnetically sensitive componentsSUSS MICROTEC TEST SYS GMBH·Filed 2008·Granted Jun 22, 2010·4 cites·12 claims
- 1059US7659743B2Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a waferSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Feb 9, 2010·3 cites·7 claims
- 1155US7560942B2Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatusSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Jul 14, 2009·2 cites·18 claims
- 1252US7768271B2Method for calibration of a vectorial network analyzer having more than two portsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 3, 2010·2 cites·8 claims
- 1352US7769555B2Method for calibration of a vectorial network analyzerSUSS MICROTEC TEST SYS GMBH·Filed 2007·Granted Aug 3, 2010·2 cites·7 claims
- 1451US2010045265A1Method and device for forming a temporary electrical contact to a solar cellSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 1549US7463044B2Adapter for positioning of contact tipsSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Dec 9, 2008·1 cites·13 claims
- 1649US2008158664A1Arrangement and method for image acquisition on a proberSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 1747US7282930B2Device for testing thin elementsSUSS MICROTEC TEST SYS GMBH·Filed 2005·Granted Oct 16, 2007·2 cites·24 claims
- 1846US2010011569A1Apparatus and method for assembling several semiconductor devices onto a target substrateSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 1946US2009049944A1Micromanipulator for moving a probeSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 2045US2010106439A1Process for measuring the impedance of electronic circuitsSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 2144US7265536B2Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe stationSUSS MICROTEC TEST SYS GMBH·Filed 2006·Granted Sep 4, 2007·1 cites·18 claims
- 2243US2009021275A1Method and arrangement for positioning a probe cardSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 2342US2008281537A1Process for Measuring the Impedance of Electronic CircuitsSUSS MICROTEC TEST SYS GMBH·Filed 2007·Application pending·0 cites
- 2440US2008284457A1Method and apparatus for control of a positioning deviceSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 2540US2010029022A1Method for improved utilization of semiconductor materialSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 2639US2009314051A1Method for determination of electrical properties of electronic componets and method for calibration of a measuring unitSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 2738US2010045264A1Probe for temporarily electrically contacting a solar cellSUSS MICROTEC TEST SYS GMBH·Filed 2009·Application pending·0 cites
- 2838US2008195344A1Method for determining measurement errors in scattering parameter measurementsSUSS MICROTEC TEST SYS GMBH·Filed 2008·Application pending·0 cites
- 2937US2007064992A1Process for the inspection of a variety of repetitive structuresSUSS MICROTEC TEST SYS GMBH·Filed 2006·Application pending·0 cites
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