Assignee
WATANABE DAISUKE
JP·31 granted patents·9 pending applications·115 citations·filing 2007–2014
Top patents by PatentIndex Score
40 records- 0194US8995181B2Magnetoresistive elementWATANABE DAISUKE·Filed 2013·Granted Mar 31, 2015·14 cites·20 claims
- 0289US8659103B2Magnetoresistive element and magnetic memory using the sameWATANABE DAISUKE·Filed 2012·Granted Feb 25, 2014·10 cites·18 claims
- 0388US8393671B2Steering support frameWATANABE DAISUKE·Filed 2011·Granted Mar 12, 2013·14 cites·3 claims
- 0485US9317735B2Information processing apparatus, information processing method, and program to calculate position and posture of an object having a three-dimensional shapeWATANABE DAISUKE·Filed 2011·Granted Apr 19, 2016·8 cites·11 claims
- 0583US8144418B2Test device for magnetic storage device, magnetic storage device, and method of manufacturing magnetic storage deviceWATANABE DAISUKE·Filed 2009·Granted Mar 27, 2012·5 cites·22 claims
- 0682US8915989B2Porous coordination polymer, process for producing same, gas storage method, and gas separation methodWATANABE DAISUKE·Filed 2011·Granted Dec 23, 2014·7 cites·7 claims
- 0782US8302918B2Fastening bracket of deck cross memberWATANABE DAISUKE·Filed 2011·Granted Nov 6, 2012·8 cites·7 claims
- 0880US8182930B2Twisted wire and method of producing twisted wireWATANABE DAISUKE·Filed 2009·Granted May 22, 2012·8 cites·3 claims
- 0978US8269569B2Test apparatus for digital modulated signalWATANABE DAISUKE·Filed 2009·Granted Sep 18, 2012·6 cites·12 claims
- 1076US8792726B2Geometric feature extracting device, geometric feature extracting method, storage medium, three-dimensional measurement apparatus, and object recognition apparatusWATANABE DAISUKE·Filed 2011·Granted Jul 29, 2014·4 cites·10 claims
- 1173US8754631B2Test apparatus for digital modulated signalWATANABE DAISUKE·Filed 2008·Granted Jun 17, 2014·5 cites·11 claims
- 1272US8278961B2Test apparatus and test methodWATANABE DAISUKE·Filed 2009·Granted Oct 2, 2012·6 cites·15 claims
- 1371US9355453B2Three-dimensional measurement apparatus, model generation apparatus, processing method thereof, and non-transitory computer-readable storage mediumWATANABE DAISUKE·Filed 2011·Granted May 31, 2016·3 cites·24 claims
- 1471US8239147B2Test apparatus and manufacturing methodWATANABE DAISUKE·Filed 2009·Granted Aug 7, 2012·2 cites·7 claims
- 1570US8466702B2Test system and substrate unit for testingWATANABE DAISUKE·Filed 2010·Granted Jun 18, 2013·2 cites·11 claims
- 1666US9467682B2Information processing apparatus and methodWATANABE DAISUKE·Filed 2011·Granted Oct 11, 2016·1 cites·18 claims
- 1766US8892381B2Test apparatus and manufacturing methodWATANABE DAISUKE·Filed 2011·Granted Nov 18, 2014·1 cites·11 claims
- 1864US8111844B2Semiconductor integrated circuit and condenser microphoneWATANABE DAISUKE·Filed 2009·Granted Feb 7, 2012·2 cites·8 claims
- 1963US8614465B2Electronic device and manufacturing methodWATANABE DAISUKE·Filed 2011·Granted Dec 24, 2013·1 cites·6 claims
- 2063US8299810B2Test apparatus and electronic deviceWATANABE DAISUKE·Filed 2009·Granted Oct 30, 2012·2 cites·14 claims
- 2162US8593166B2Semiconductor wafer, semiconductor circuit, substrate for testing and test systemWATANABE DAISUKE·Filed 2010·Granted Nov 26, 2013·1 cites·9 claims
- 2261US8270225B2Data receiving circuitWATANABE DAISUKE·Filed 2008·Granted Sep 18, 2012·3 cites·8 claims
- 2361US2015054185A1Method for Producing Wafer LensWATANABE DAISUKE·Filed 2014·Application pending·0 cites
- 2461US2011018151A1Method for Producing Wafer LensWATANABE DAISUKE·Filed 2009·Application pending·0 cites
- 2560US8456170B2Test apparatus for digital modulated signalWATANABE DAISUKE·Filed 2008·Granted Jun 4, 2013·1 cites·12 claims
- 2657US8643412B2Test apparatus, transmission apparatus, receiving apparatus, test method, transmission method and receiving methodWATANABE DAISUKE·Filed 2011·Granted Feb 4, 2014·1 cites·20 claims
- 2757US2014284733A1Magnetoresistive elementWATANABE DAISUKE·Filed 2013·Application pending·0 cites
- 2853US2008026264A1Fuel cell system and operation control method thereforeWATANABE DAISUKE·Filed 2007·Application pending·0 cites
- 2951US2007281189A1Fuel cell apparatusWATANABE DAISUKE·Filed 2007·Application pending·0 cites
- 3050US2008055037A1Inductance variable deviceWATANABE DAISUKE·Filed 2007·Application pending·0 cites
- 3150US2007202384A1Cell stack unit of fuel cell and fuel cell device with the sameWATANABE DAISUKE·Filed 2007·Application pending·0 cites
- 3249US2012319794A1Test apparatus for digital modulated signalWATANABE DAISUKE·Filed 2012·Application pending·0 cites
- 3348US8441648B2Calibration jig for optical tomographic imaging apparatus and method for generating a calibration conversion tableWATANABE DAISUKE·Filed 2009·Granted May 14, 2013·0 cites·15 claims
- 3447US8150648B2Timing generatorWATANABE DAISUKE·Filed 2008·Granted Apr 3, 2012·0 cites·10 claims
- 3546US8392145B2Timing generatorWATANABE DAISUKE·Filed 2012·Granted Mar 5, 2013·0 cites·9 claims
- 3644US8610449B2Wafer unit for testing and test systemWATANABE DAISUKE·Filed 2010·Granted Dec 17, 2013·0 cites·20 claims
- 3742US8400725B2Storage device and method for controlling projection amount of headWATANABE DAISUKE·Filed 2011·Granted Mar 19, 2013·0 cites·4 claims
- 3842US8278962B2Transfer circuit, transmitter, receiver and test apparatusWATANABE DAISUKE·Filed 2010·Granted Oct 2, 2012·0 cites·19 claims
- 3942US2012164387A1Molding Die, Optical Element, and Method of Preparing Molding DieWATANABE DAISUKE·Filed 2010·Application pending·0 cites
- 4041US8537935B2Clock data recovery circuit and methodWATANABE DAISUKE·Filed 2008·Granted Sep 17, 2013·0 cites·9 claims
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