Assignee
WINBOND ELECTRONICS CORP
TW·2,033 granted patents·358 pending applications·20,251 citations·filing 1991–2025
Top patents by PatentIndex Score
2,391 records- 0199US11121135B1Structure of memory deviceWINBOND ELECTRONICS CORP·Filed 2020·Granted Sep 14, 2021·20 cites·20 claims
- 0299US11056175B1Semiconductor device and manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2020·Granted Jul 6, 2021·17 cites·20 claims
- 0398US11417385B1Semiconductor memory apparatusWINBOND ELECTRONICS CORP·Filed 2021·Granted Aug 16, 2022·10 cites·16 claims
- 0498US11152305B1Semiconductor device and method of manufacturing the sameWINBOND ELECTRONICS CORP·Filed 2020·Granted Oct 19, 2021·5 cites·20 claims
- 0597US10607679B2Memory device and refreshing method thereofWINBOND ELECTRONICS CORP·Filed 2018·Granted Mar 31, 2020·34 cites·10 claims
- 0697US7558900B2Serial flash semiconductor memoryWINBOND ELECTRONICS CORP·Filed 2005·Granted Jul 7, 2009·79 cites·29 claims
- 0797US6009496AMicrocontroller with programmable embedded flash memoryWINBOND ELECTRONICS CORP·Filed 1997·Granted Dec 28, 1999·384 cites·12 claims
- 0896US9972626B1Dynamic random access memory and method of fabricating the sameWINBOND ELECTRONICS CORP·Filed 2017·Granted May 15, 2018·23 cites·5 claims
- 0996US9527508B1Mobile vehicle safety apparatus and safety monitoring method thereofWINBOND ELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·33 cites·8 claims
- 1096US7164339B2Integrated transformer with stack structureWINBOND ELECTRONICS CORP·Filed 2005·Granted Jan 16, 2007·63 cites·19 claims
- 1196US6388292B1Distributed MOSFET structure with enclosed gate for improved transistor size/layout area ratio and uniform ESD triggeringWINBOND ELECTRONICS CORP·Filed 1999·Granted May 14, 2002·129 cites·27 claims
- 1296US6301161B1Programming flash memory analog storage using coarse-and-fine sequenceWINBOND ELECTRONICS CORP·Filed 2000·Granted Oct 9, 2001·140 cites·18 claims
- 1395US11793095B2Resistive random access memory and method of fabricating the sameWINBOND ELECTRONICS CORP·Filed 2021·Granted Oct 17, 2023·6 cites·11 claims
- 1495US11239417B1Resistive random access memory and method of manufacturing the sameWINBOND ELECTRONICS CORP·Filed 2020·Granted Feb 1, 2022·4 cites·8 claims
- 1595US10965292B1Delay-locked loop device and operation method thereforWINBOND ELECTRONICS CORP·Filed 2020·Granted Mar 30, 2021·8 cites·13 claims
- 1695US9947669B1Dynamic random access memory and method of manufacturing the sameWINBOND ELECTRONICS CORP·Filed 2017·Granted Apr 17, 2018·14 cites·20 claims
- 1795US7408212B1Stackable resistive cross-point memory with schottky diode isolationWINBOND ELECTRONICS CORP·Filed 2004·Granted Aug 5, 2008·103 cites·14 claims
- 1895US6563733B2Memory array architectures based on a triple-polysilicon source-side injection non-volatile memory cellWINBOND ELECTRONICS CORP·Filed 2001·Granted May 13, 2003·118 cites·25 claims
- 1995US5920792AHigh density plasma enhanced chemical vapor deposition process in combination with chemical mechanical polishing process for preparation and planarization of intemetal dielectric layersWINBOND ELECTRONICS CORP·Filed 1998·Granted Jul 6, 1999·285 cites·11 claims
- 2095US5856214AMethod of fabricating a low voltage zener-triggered SCR for ESD protection in integrated circuitsWINBOND ELECTRONICS CORP·Filed 1996·Granted Jan 5, 1999·140 cites·9 claims
- 2195US5439839ASelf-aligned source/drain MOS processWINBOND ELECTRONICS CORP·Filed 1994·Granted Aug 8, 1995·198 cites·3 claims
- 2294US11917837B2Method of forming the semiconductor deviceWINBOND ELECTRONICS CORP·Filed 2022·Granted Feb 27, 2024·2 cites·10 claims
- 2394US11800815B2Resistive random access memory cell and method of fabricating the sameWINBOND ELECTRONICS CORP·Filed 2021·Granted Oct 24, 2023·2 cites·18 claims
- 2494US11737380B2Resistive random access memory structure and manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2020·Granted Aug 22, 2023·3 cites·6 claims
- 2594US11631685B2Memory device and method of manufacturing the sameWINBOND ELECTRONICS CORP·Filed 2021·Granted Apr 18, 2023·4 cites·8 claims
- 2694US11429131B2Constant current circuit and semiconductor apparatusWINBOND ELECTRONICS CORP·Filed 2020·Granted Aug 30, 2022·6 cites·11 claims
- 2794US11269365B2Voltage-generating circuit and semiconductor device using the sameWINBOND ELECTRONICS CORP·Filed 2020·Granted Mar 8, 2022·3 cites·20 claims
- 2894US11114180B1Non-volatile memory deviceWINBOND ELECTRONICS CORP·Filed 2020·Granted Sep 7, 2021·5 cites·19 claims
- 2994US11088677B1Signal receiving deviceWINBOND ELECTRONICS CORP·Filed 2020·Granted Aug 10, 2021·5 cites·10 claims
- 3094US10734390B1Method of manufacturing memory deviceWINBOND ELECTRONICS CORP·Filed 2019·Granted Aug 4, 2020·12 cites·16 claims
- 3194US10636842B1Resistive random access memory and method for forming the sameWINBOND ELECTRONICS CORP·Filed 2019·Granted Apr 28, 2020·13 cites·20 claims
- 3294US10083906B1Memory device with buried word line for reduced gate-induced drain leakage current and method for manufacturing the sameWINBOND ELECTRONICS CORP·Filed 2018·Granted Sep 25, 2018·11 cites·20 claims
- 3394US6946702B2Resistance random access memoryWINBOND ELECTRONICS CORP·Filed 2003·Granted Sep 20, 2005·85 cites·15 claims
- 3494US6384737B1Method and apparatus for allowing a personal computer to control one or more devicesWINBOND ELECTRONICS CORP·Filed 1998·Granted May 7, 2002·259 cites·17 claims
- 3594US6200856B1Method of fabricating self-aligned stacked gate flash memory cellWINBOND ELECTRONICS CORP·Filed 1998·Granted Mar 13, 2001·117 cites·8 claims
- 3694US5631793ACapacitor-couple electrostatic discharge protection circuitWINBOND ELECTRONICS CORP·Filed 1995·Granted May 20, 1997·142 cites·11 claims
- 3793US11657864B1In-memory computing apparatus and computing method having a memory array includes a shifted weight storage, shift information storage and shift restoration circuit to restore a weigh shifted amount of shifted sum-of-products to generate multiple restored sum-of-productsWINBOND ELECTRONICS CORP·Filed 2021·Granted May 23, 2023·3 cites·14 claims
- 3893US11107983B2Resistive random access memory array and manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2020·Granted Aug 31, 2021·4 cites·17 claims
- 3993US9716223B1RRAM device and method for manufacturing the sameWINBOND ELECTRONICS CORP·Filed 2016·Granted Jul 25, 2017·10 cites·20 claims
- 4093US9691980B1Method for forming memory deviceWINBOND ELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·11 cites·10 claims
- 4193US9576652B1Resistive random access memory apparatus with forward and reverse reading modesWINBOND ELECTRONICS CORP·Filed 2016·Granted Feb 21, 2017·11 cites·11 claims
- 4293US9245639B1NAND flash memory array architecture having low read latency and low program disturbWINBOND ELECTRONICS CORP·Filed 2014·Granted Jan 26, 2016·20 cites·9 claims
- 4393US7906396B1Flash memory and method of fabricating the sameWINBOND ELECTRONICS CORP·Filed 2009·Granted Mar 15, 2011·35 cites·14 claims
- 4493US6919602B2Gate-coupled MOSFET ESD protection circuitWINBOND ELECTRONICS CORP·Filed 2002·Granted Jul 19, 2005·81 cites·20 claims
- 4593US6037649AThree-dimension inductor structure in integrated circuit technologyWINBOND ELECTRONICS CORP·Filed 1999·Granted Mar 14, 2000·178 cites·9 claims
- 4692US11751380B2Semiconductor memory structureWINBOND ELECTRONICS CORP·Filed 2021·Granted Sep 5, 2023·4 cites·20 claims
- 4792US11309433B2Non-volatile memory structure and manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2020·Granted Apr 19, 2022·3 cites·13 claims
- 4892US11004499B1Latency control circuit and methodWINBOND ELECTRONICS CORP·Filed 2020·Granted May 11, 2021·5 cites·19 claims
- 4992US10697919B2Reduction-oxidation sensor device and manufacturing method thereofWINBOND ELECTRONICS CORP·Filed 2018·Granted Jun 30, 2020·5 cites·13 claims
- 5092US9636513B2Defibrillator deviceWINBOND ELECTRONICS CORP·Filed 2015·Granted May 2, 2017·23 cites·6 claims
Showing the top 50 of 2,391 patent records by PatentIndex Score.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →