Assignee
XANDEX INC
US·13 granted patents·6 pending applications·752 citations·filing 1992–2007
Top patents by PatentIndex Score
19 records- 0195US5528158AProbe card changer system and methodXANDEX INC·Filed 1994·Granted Jun 18, 1996·145 cites·28 claims
- 0294US6166553AProber-tester electrical interface for semiconductor testXANDEX INC·Filed 1998·Granted Dec 26, 2000·137 cites·28 claims
- 0392US6888427B2Flex-circuit-based high speed transmission lineXANDEX INC·Filed 2003·Granted May 3, 2005·72 cites·33 claims
- 0490US5506498AProbe card system and methodXANDEX INC·Filed 1995·Granted Apr 9, 1996·112 cites·21 claims
- 0589US6027346AMembrane-supported contactor for semiconductor testXANDEX INC·Filed 1998·Granted Feb 22, 2000·110 cites·18 claims
- 0686US7358754B2Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentXANDEX INC·Filed 2006·Granted Apr 15, 2008·11 cites·15 claims
- 0786US7078890B2Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentXANDEX INC·Filed 2005·Granted Jul 18, 2006·12 cites·16 claims
- 0883US6833696B2Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentXANDEX INC·Filed 2003·Granted Dec 21, 2004·21 cites·43 claims
- 0981US6963211B2Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentXANDEX INC·Filed 2004·Granted Nov 8, 2005·19 cites·35 claims
- 1077US6107813AProbe card changer system and methodXANDEX INC·Filed 1996·Granted Aug 22, 2000·40 cites·8 claims
- 1173US5471148AProbe card changer system and methodXANDEX INC·Filed 1994·Granted Nov 28, 1995·35 cites·21 claims
- 1273US5254939AProbe card systemXANDEX INC·Filed 1992·Granted Oct 19, 1993·32 cites·29 claims
- 1361US7295024B2Contact signal blocks for transmission of high-speed signalsXANDEX INC·Filed 2006·Granted Nov 13, 2007·6 cites·11 claims
- 1446US2008030213A1Active probe contact array managementXANDEX INC·Filed 2007·Application pending·0 cites
- 1546US2008030212A1Active probe contact array managementXANDEX INC·Filed 2007·Application pending·0 cites
- 1646US2008030211A1Active probe contact array managementXANDEX INC·Filed 2007·Application pending·0 cites
- 1745US2008025012A1Contact signal blocks for transmission of high-speed signalsXANDEX INC·Filed 2007·Application pending·0 cites
- 1844US2007176615A1Active probe contact array managementXANDEX INC·Filed 2006·Application pending·0 cites
- 1943US2007126439A1Methods and apparatus for creating a high speed connection between a device under test and automatic test equipmentXANDEX INC·Filed 2006·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →