Assignee
YIN HAIZHOU
US·47 granted patents·36 pending applications·181 citations·filing 2010–2013
Top patents by PatentIndex Score
83 records- 0198US8835316B2Transistor with primary and semiconductor spacer, method for manufacturing transistor, and semiconductor chip comprising the transistorYIN HAIZHOU·Filed 2011·Granted Sep 16, 2014·77 cites·9 claims
- 0291US8669155B2Hybrid channel semiconductor device and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Mar 11, 2014·14 cites·8 claims
- 0389US8232178B2Method for forming a semiconductor device with stressed trench isolationYIN HAIZHOU·Filed 2011·Granted Jul 31, 2012·10 cites·9 claims
- 0488US8198673B2Asymmetric epitaxy and application thereofYIN HAIZHOU·Filed 2011·Granted Jun 12, 2012·8 cites·8 claims
- 0587US8642471B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Feb 4, 2014·9 cites·12 claims
- 0686US8643061B2Structure of high-K metal gate semiconductor transistorYIN HAIZHOU·Filed 2010·Granted Feb 4, 2014·8 cites·20 claims
- 0785US8546910B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Oct 1, 2013·7 cites·10 claims
- 0884US8969930B2Gate stack structure, semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Mar 3, 2015·7 cites·8 claims
- 0982US8541280B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Sep 24, 2013·6 cites·11 claims
- 1077US8236636B2Hybrid orientation semiconductor structure with reduced boundary defects and method of forming sameYIN HAIZHOU·Filed 2010·Granted Aug 7, 2012·3 cites·20 claims
- 1173US9576802B2Semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Feb 21, 2017·3 cites·10 claims
- 1273US8829642B2Semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Sep 9, 2014·3 cites·13 claims
- 1372US8692335B2Source/drain region, contact hole and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Apr 8, 2014·3 cites·22 claims
- 1472US8530328B1Method for manufacturing semiconductor deviceYIN HAIZHOU·Filed 2012·Granted Sep 10, 2013·3 cites·6 claims
- 1570US9012274B2Method of manufacturing a semiconductor fin using sacrificial layerYIN HAIZHOU·Filed 2012·Granted Apr 21, 2015·2 cites·8 claims
- 1670US8669160B2Method for manufacturing a semiconductor deviceYIN HAIZHOU·Filed 2012·Granted Mar 11, 2014·2 cites·10 claims
- 1769US8399328B2Transistor and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Mar 19, 2013·2 cites·8 claims
- 1866US8809134B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Aug 19, 2014·2 cites·13 claims
- 1966US8409941B2Semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2010·Granted Apr 2, 2013·2 cites·10 claims
- 2066US8399315B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2010·Granted Mar 19, 2013·2 cites·6 claims
- 2164US9614050B2Method for manufacturing semiconductor devicesYIN HAIZHOU·Filed 2012·Granted Apr 4, 2017·2 cites·12 claims
- 2263US8575654B2Method of forming strained semiconductor channel and semiconductor deviceYIN HAIZHOU·Filed 2010·Granted Nov 5, 2013·1 cites·11 claims
- 2362US9082849B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Jul 14, 2015·1 cites·11 claims
- 2462US8772127B2Semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Jul 8, 2014·1 cites·16 claims
- 2561US9209269B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Dec 8, 2015·1 cites·7 claims
- 2661US8466013B2Method for manufacturing a semiconductor structureYIN HAIZHOU·Filed 2011·Granted Jun 18, 2013·1 cites·12 claims
- 2760US8440558B2Semiconductor device and method of fabricating the sameYIN HAIZHOU·Filed 2010·Granted May 14, 2013·1 cites·7 claims
- 2860US2013276872A1Solar cell unit and method for manufacturing the sameYIN HAIZHOU·Filed 2013·Application pending·0 cites
- 2949US8564029B2Transistor and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Oct 22, 2013·0 cites·5 claims
- 3049US8507958B2Transistor and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Aug 13, 2013·0 cites·7 claims
- 3147US9373722B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Jun 21, 2016·0 cites·37 claims
- 3247US8765540B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Jul 1, 2014·0 cites·10 claims
- 3346US9548317B2FDSOI semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Jan 17, 2017·0 cites·8 claims
- 3445US8415621B2Method for line width measurementYIN HAIZHOU·Filed 2011·Granted Apr 9, 2013·0 cites·16 claims
- 3544US9691878B2Method of manufacturing MOSFETYIN HAIZHOU·Filed 2012·Granted Jun 27, 2017·0 cites·13 claims
- 3644US9147762B2Semiconductor device and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Granted Sep 29, 2015·0 cites·9 claims
- 3744US8815698B2Well region formation method and semiconductor baseYIN HAIZHOU·Filed 2011·Granted Aug 26, 2014·0 cites·11 claims
- 3843US8906753B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Dec 9, 2014·0 cites·18 claims
- 3943US8426282B2Method for forming semiconductor substrate isolationYIN HAIZHOU·Filed 2011·Granted Apr 23, 2013·0 cites·8 claims
- 4042US8952429B2Transistor and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Feb 10, 2015·0 cites·11 claims
- 4142US2014197410A1Semiconductor Structure and Method for Manufacturing the SameYIN HAIZHOU·Filed 2012·Application pending·0 cites
- 4241US9082717B2Isolation region, semiconductor device and methods for forming the sameYIN HAIZHOU·Filed 2011·Granted Jul 14, 2015·0 cites·3 claims
- 4341US8822334B2Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2011·Granted Sep 2, 2014·0 cites·5 claims
- 4441US8420489B2High-performance semiconductor device and method of manufacturing the sameYIN HAIZHOU·Filed 2010·Granted Apr 16, 2013·0 cites·18 claims
- 4541US8420490B2High-performance semiconductor device and method of manufacturing the sameYIN HAIZHOU·Filed 2010·Granted Apr 16, 2013·0 cites·12 claims
- 4641US2015171186A1Semiconductor device manufacturing methodYIN HAIZHOU·Filed 2012·Application pending·0 cites
- 4741US2015084130A1Semiconductor structure and method for manufacturing the sameYIN HAIZHOU·Filed 2012·Application pending·0 cites
- 4841US2013256810A1Semiconductor Device and Method for Manufacturing the SameYIN HAIZHOU·Filed 2012·Application pending·0 cites
- 4940US9530861B2Method for manufacturing semiconductor deviceYIN HAIZHOU·Filed 2012·Granted Dec 27, 2016·0 cites·9 claims
- 5040US8546241B2Semiconductor device with stress trench isolation and method for forming the sameYIN HAIZHOU·Filed 2011·Granted Oct 1, 2013·0 cites·15 claims
Showing the top 50 of 83 patent records by PatentIndex Score.
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