Assignee
ZYVEX INSTR LLC
US·3 granted patents·1 pending application·110 citations·filing 2004–2007
Top patents by PatentIndex Score
4 records- 0195US7319336B2Charged particle beam device probe operationZYVEX INSTR LLC·Filed 2005·Granted Jan 15, 2008·63 cites·19 claims
- 0287US7675300B2Charged particle beam device probe operationZYVEX INSTR LLC·Filed 2007·Granted Mar 9, 2010·12 cites·27 claims
- 0385US7227140B2Method, system and device for microscopic examination employing fib-prepared sample grasping elementZYVEX INSTR LLC·Filed 2004·Granted Jun 5, 2007·35 cites·69 claims
- 0451US2007187623A1Method, System and Device for Microscopic Examination Employing Fib-Prepared Sample Grasping ElementZYVEX INSTR LLC·Filed 2007·Application pending·0 cites
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