Inventor
HUANG CHIEN-CHANG
TW60 patents
⚠️ This page may combine multiple inventors who share the name “HUANG CHIEN-CHANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NANYA TECHNOLOGY CORP
15 patentsUS7026647B2Apr 11, 2006
Device and method for detecting alignment of active areas and memory cell structures in DRAM devices
NANYA TECHNOLOGY CORP11 citations84
US6902942B2Jun 7, 2005
Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices
NANYA TECHNOLOGY CORP12 citations84
US6693834B1Feb 17, 2004
Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices
NANYA TECHNOLOGY CORP13 citations84
US6891216B1May 10, 2005
Test structure of DRAM
NANYA TECHNOLOGY CORP11 citations73
US7381575B2Jun 3, 2008
Device and method for detecting alignment of active areas and memory cell structures in DRAM devices
NANYA TECHNOLOGY CORP2 citations62
US7217581B2May 15, 2007
Misalignment test structure and method thereof
NANYA TECHNOLOGY CORP4 citations62
US6984534B2Jan 10, 2006
Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal
NANYA TECHNOLOGY CORP2 citations62
US6946678B2Sep 20, 2005
Test key for validating the position of a word line overlaying a trench capacitor in DRAMs
NANYA TECHNOLOGY CORP4 citations62
US6875654B2Apr 5, 2005
Memory device and fabrication method thereof
NANYA TECHNOLOGY CORP4 citations62
US6838296B2Jan 4, 2005
Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices
NANYA TECHNOLOGY CORP3 citations62
US7160804B2Jan 9, 2007
Method of fabricating MOS transistor by millisecond anneal
NANYA TECHNOLOGY CORP2 citations61
US6812487B1Nov 2, 2004
Test key and method for validating the doping concentration of buried layers within a deep trench capacitors
NANYA TECHNOLOGY CORP4 citations60
US7091545B2Aug 15, 2006
Memory device and fabrication method thereof
NANYA TECHNOLOGY CORP0 citations52
US6844207B2Jan 18, 2005
Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal
NANYA TECHNOLOGY CORP1 citations52
US6825053B2Nov 30, 2004
Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMS
NANYA TECHNOLOGY CORP0 citations52
TAIWAN SEMICONDUCTOR MFG CO LTD
11 patentsUS10157946B2Dec 18, 2018
Method for forming CMOS image sensor structure
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9818779B2Nov 14, 2017
CMOS image sensor structure
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US10438980B2Oct 8, 2019
Image sensor with a high absorption layer
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US10157944B2Dec 18, 2018
CMOS image sensor structure
TAIWAN SEMICONDUCTOR MFG CO LTD14 citations82
US11996429B2May 28, 2024
CMOS image sensor structure with microstructures on backside surface of semiconductor layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11177302B2Nov 16, 2021
CMOS image sensor structure with microstructures formed on semiconductor layer
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9620553B2Apr 11, 2017
CMOS image sensor structure with crosstalk improvement
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9397130B1Jul 19, 2016
CMOS image sensor structure with crosstalk improvement
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US10868053B2Dec 15, 2020
Image sensor with a high absorption layer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11830892B2Nov 28, 2023
Image sensor with a high absorption layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9269733B2Feb 23, 2016
Image sensor device with improved quantum efficiency
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
PIXART IMAGING INC
9 patentsUS7242391B2Jul 10, 2007
Optical navigation chip
PIXART IMAGING INC20 citations92
US7053932B2May 30, 2006
Method for detecting movement of image sensors
PIXART IMAGING INC30 citations92
US7169633B2Jan 30, 2007
Solid-state image sensor for improving sensing quality and manufacturing method thereof
PIXART IMAGING INC10 citations84
US7151561B2Dec 19, 2006
Method for detecting movement of image sensors
PIXART IMAGING INC13 citations84
US7173652B2Feb 6, 2007
Method for detecting movement of image sensors
PIXART IMAGING INC7 citations73
US7323378B2Jan 29, 2008
Method for fabricating CMOS image sensor
PIXART IMAGING INC6 citations63
US7705367B2Apr 27, 2010
Pinned photodiode sensor with gate-controlled silicon-controlled rectifier transfer switch and method of formation
PIXART IMAGING INC0 citations52
US7436011B2Oct 14, 2008
CMOS image sensor
PIXART IMAGING INC1 citations52
US7348534B2Mar 25, 2008
Method for controlling active pixel elements and active pixel arrays having a column-read transistor for reading signals
PIXART IMAGING INC0 citations52
HUANG CHIEN-CHANG
6 patentsUS8798953B2Aug 5, 2014
Calibration method for radio frequency scattering parameter measurement applying three calibrators and measurement structure thereof
HUANG CHIEN-CHANG5 citations73
US8579242B2Nov 12, 2013
Elevating mechanism for projection apparatus
HUANG CHIEN-CHANG6 citations71
US8552742B2Oct 8, 2013
Calibration method for radio frequency scattering parameter measurements
HUANG CHIEN-CHANG2 citations62
US8056493B2Nov 15, 2011
Underwater vehicle for spearfishing
HUANG CHIEN-CHANG2 citations62
US8503105B2Aug 6, 2013
Zooming adjustment mechanism and projection lens module
HUANG CHIEN-CHANG4 citations61
US8128234B2Mar 6, 2012
Position adjustment device for integration rod
HUANG CHIEN-CHANG3 citations61
WINBOND ELECTRONICS CORP
2 patentsUNIVERSAL FOODS CORP
2 patentsPIXART IMAGNING INC
1 patentHANNSTAR DISPLAY CORP
1 patentNANYA TECHONOLGY CORP
1 patentUNIV YUAN ZE
1 patentIND TECH RES INST
1 patentShowing the top 50 of 60 patents by PatentIndex Score.