P

Inventor

HUANG CHIEN-CHANG

TW60 patents
⚠️ This page may combine multiple inventors who share the name “HUANG CHIEN-CHANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NANYA TECHNOLOGY CORP

15 patents
US7026647B2Apr 11, 2006

Device and method for detecting alignment of active areas and memory cell structures in DRAM devices

NANYA TECHNOLOGY CORP11 citations84
US6902942B2Jun 7, 2005

Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices

NANYA TECHNOLOGY CORP12 citations84
US6693834B1Feb 17, 2004

Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices

NANYA TECHNOLOGY CORP13 citations84
US6891216B1May 10, 2005

Test structure of DRAM

NANYA TECHNOLOGY CORP11 citations73
US7381575B2Jun 3, 2008

Device and method for detecting alignment of active areas and memory cell structures in DRAM devices

NANYA TECHNOLOGY CORP2 citations62
US7217581B2May 15, 2007

Misalignment test structure and method thereof

NANYA TECHNOLOGY CORP4 citations62
US6984534B2Jan 10, 2006

Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal

NANYA TECHNOLOGY CORP2 citations62
US6946678B2Sep 20, 2005

Test key for validating the position of a word line overlaying a trench capacitor in DRAMs

NANYA TECHNOLOGY CORP4 citations62
US6875654B2Apr 5, 2005

Memory device and fabrication method thereof

NANYA TECHNOLOGY CORP4 citations62
US6838296B2Jan 4, 2005

Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices

NANYA TECHNOLOGY CORP3 citations62
US7160804B2Jan 9, 2007

Method of fabricating MOS transistor by millisecond anneal

NANYA TECHNOLOGY CORP2 citations61
US6812487B1Nov 2, 2004

Test key and method for validating the doping concentration of buried layers within a deep trench capacitors

NANYA TECHNOLOGY CORP4 citations60
US7091545B2Aug 15, 2006

Memory device and fabrication method thereof

NANYA TECHNOLOGY CORP0 citations52
US6844207B2Jan 18, 2005

Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal

NANYA TECHNOLOGY CORP1 citations52
US6825053B2Nov 30, 2004

Test key and method for validating the position of a word line overlaying a trench capacitor in DRAMS

NANYA TECHNOLOGY CORP0 citations52

TAIWAN SEMICONDUCTOR MFG CO LTD

11 patents

PIXART IMAGING INC

9 patents

HUANG CHIEN-CHANG

6 patents

WINBOND ELECTRONICS CORP

2 patents

UNIVERSAL FOODS CORP

2 patents

PIXART IMAGNING INC

1 patent

HANNSTAR DISPLAY CORP

1 patent

NANYA TECHONOLGY CORP

1 patent

UNIV YUAN ZE

1 patent

IND TECH RES INST

1 patent

Showing the top 50 of 60 patents by PatentIndex Score.