Inventor
MURATA AKIHIRO
JP35 patents
⚠️ This page may combine multiple inventors who share the name “MURATA AKIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO EPSON CORP
29 patentsUS6623178B1Sep 23, 2003
Optical module and method of manufacture thereof, semiconductor device, and optical transmission device
SEIKO EPSON CORP61 citations96
US6568863B2May 27, 2003
Platform and optical module, method of manufacture thereof, and optical transmission device
SEIKO EPSON CORP70 citations96
US6400010B1Jun 4, 2002
Substrate including a metal portion and a resin portion
SEIKO EPSON CORP46 citations96
US7301703B2Nov 27, 2007
Tunable filter and method of manufacturing the same, and sensing device
SEIKO EPSON CORP20 citations93
US7286244B2Oct 23, 2007
Analyzer
SEIKO EPSON CORP26 citations92
US7130103B2Oct 31, 2006
Optical modulator and manufacturing method of optical modulator
SEIKO EPSON CORP36 citations92
US7106514B2Sep 12, 2006
Optical tunable filter and method for manufacturing the optical tunable filter
SEIKO EPSON CORP22 citations92
US7029946B2Apr 18, 2006
Method for manufacturing semiconductor device and semiconductor device
SEIKO EPSON CORP21 citations92
US6915049B2Jul 5, 2005
Optical module and method of manufacturing the same, and optical transmission device
SEIKO EPSON CORP34 citations92
US6724061B2Apr 20, 2004
Optical device and method of manufacture thereof, and electronic instrument
SEIKO EPSON CORP16 citations92
US6517259B1Feb 11, 2003
Optical module and method of manufacturing the same, and optical transmission device
SEIKO EPSON CORP43 citations92
US6483184B2Nov 19, 2002
Semiconductor apparatus substrate, semiconductor apparatus, and method of manufacturing thereof and electronic apparatus
SEIKO EPSON CORP28 citations92
US7304800B2Dec 4, 2007
Optical tunable filter and method of manufacturing the same
SEIKO EPSON CORP17 citations84
US6961182B2Nov 1, 2005
Micro electro mechanical systems device, method of manufacturing the same and micro electro mechanical systems module
SEIKO EPSON CORP15 citations84
US6793405B1Sep 21, 2004
Optical module
SEIKO EPSON CORP18 citations84
US6425695B1Jul 30, 2002
Optical module and method of manufacturing the same
SEIKO EPSON CORP18 citations84
US7096579B2Aug 29, 2006
Method of manufacturing an optical device
SEIKO EPSON CORP5 citations74
US6586274B2Jul 1, 2003
Semiconductor device, substrate for a semiconductor device, method of manufacture thereof, and electronic instrument
SEIKO EPSON CORP8 citations74
US6281045B1Aug 28, 2001
Semiconductor apparatus, manufacturing method thereof and electronic apparatus
SEIKO EPSON CORP9 citations74
US9568996B2Feb 14, 2017
Image display device and display control method for image display device
SEIKO EPSON CORP4 citations72
US6972636B2Dec 6, 2005
Method of manufacturing a high-frequency switch, a high-frequency switch and an electronic apparatus
SEIKO EPSON CORP6 citations63
US6917745B2Jul 12, 2005
Platform and optical module, manufacturing method of the same, and optical transmission device
SEIKO EPSON CORP4 citations63
US7884990B2Feb 8, 2011
Actuator, optical scanner and image-forming device
SEIKO EPSON CORP1 citations62
US7733551B2Jun 8, 2010
Actuator, optical scanner and image-forming device
SEIKO EPSON CORP4 citations62
US12245509B2Mar 4, 2025
Method for manufacturing vibration device
SEIKO EPSON CORP0 citations52
US8035878B2Oct 11, 2011
Actuator, optical scanner and image-forming device
SEIKO EPSON CORP0 citations52
US7040817B2May 9, 2006
Three-dimensional mounted assembly and optical transmission device
SEIKO EPSON CORP0 citations52
US6945707B2Sep 20, 2005
Three-dimensional mounted assembly and optical transmission device
SEIKO EPSON CORP0 citations52
US6918705B2Jul 19, 2005
Optical module and method of manufacture thereof, semiconductor device, and optical transmission device
SEIKO EPSON CORP1 citations52
YOKOGAWA ELECTRIC CORP
2 patentsUS5715055AFeb 3, 1998
Spectroscope utilizing a coupler to concurrently apply parallel light beams to a sample and a reference light and processing the resulting light beams thereby compensating for environmental changes
YOKOGAWA ELECTRIC CORP9 citations72
US11150182B2Oct 19, 2021
Testing method and testing system
YOKOGAWA ELECTRIC CORP0 citations53