Inventor
KOTTI RADHAKRISHNA
US14 patents
Patents
14 patentsUS11222695B2Jan 11, 2022
Socket design for a memory device
MICRON TECHNOLOGY INC1 citations72
US11515204B2Nov 29, 2022
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC1 citations69
US11302589B2Apr 12, 2022
Electron beam probing techniques and related structures
MICRON TECHNOLOGY INC2 citations68
US12548621B2Feb 10, 2026
Socket design for a memory device
MICRON TECHNOLOGY INC0 citations62
US11961556B2Apr 16, 2024
Socket design for a memory device
MICRON TECHNOLOGY INC0 citations62
US12438083B2Oct 7, 2025
Assemblies having conductive interconnects which are laterally and vertically offset relative to one another
MICRON TECHNOLOGY INC0 citations61
US12014983B2Jun 18, 2024
Assemblies having conductive interconnects which are laterally and vertically offset relative to one another and methods of forming assemblies having conductive interconnects which are laterally and vertically offset relative to one another
MICRON TECHNOLOGY INC0 citations61
US11482492B2Oct 25, 2022
Assemblies having conductive interconnects which are laterally and vertically offset relative to one another
MICRON TECHNOLOGY INC0 citations61
US12387981B2Aug 12, 2025
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC0 citations59
US11990370B2May 21, 2024
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC0 citations59
US11636911B2Apr 25, 2023
Leakage source detection for memory with varying conductive path lengths
MICRON TECHNOLOGY INC0 citations58
US11574842B2Feb 7, 2023
Methods for forming conductive vias, and associated devices and systems
MICRON TECHNOLOGY INC0 citations58
US11081203B2Aug 3, 2021
Leakage source detection by scanning access lines
MICRON TECHNOLOGY INC0 citations58
US11996336B2May 28, 2024
Electron beam probing techniques and related structures
MICRON TECHNOLOGY INC0 citations57