Inventor
ERHARDT JEFFREY P
US15 patents
Patents
15 patentsUS7101722B1Sep 5, 2006
In-line voltage contrast determination of tunnel oxide weakness in integrated circuit technology development
ADVANCED MICRO DEVICES INC81 citations96
US6350696B1Feb 26, 2002
Spacer etch method for semiconductor device
ADVANCED MICRO DEVICES INC16 citations83
US6815233B1Nov 9, 2004
Method of simultaneous display of die and wafer characterization in integrated circuit technology development
ADVANCED MICRO DEVICES INC10 citations72
US7137085B1Nov 14, 2006
Wafer level global bitmap characterization in integrated circuit technology development
ADVANCED MICRO DEVICES INC8 citations70
US7590309B1Sep 15, 2009
Image processing in integrated circuit technology development
ADVANCED MICRO DEVICES INC3 citations62
US6770523B1Aug 3, 2004
Method for semiconductor wafer planarization by CMP stop layer formation
ADVANCED MICRO DEVICES INC5 citations62
US6723605B1Apr 20, 2004
Method for manufacturing memory with high conductivity bitline and shallow trench isolation integration
ADVANCED MICRO DEVICES INC5 citations62
US7208382B1Apr 24, 2007
Semiconductor device with high conductivity region using shallow trench
ADVANCED MICRO DEVICES INC4 citations61
US7197435B1Mar 27, 2007
Method and apparatus for using clustering method to analyze semiconductor devices
ADVANCED MICRO DEVICES INC2 citations61
US7143370B1Nov 28, 2006
Parameter linking system for data visualization in integrated circuit technology development
ADVANCED MICRO DEVICES INC6 citations61
US7263451B1Aug 28, 2007
Method and apparatus for correlating semiconductor process data with known prior process data
ADVANCED MICRO DEVICES INC1 citations51
US6875560B1Apr 5, 2005
Testing multiple levels in integrated circuit technology development
ADVANCED MICRO DEVICES INC1 citations51
US6864107B1Mar 8, 2005
Determination of nonphotolithographic wafer process-splits in integrated circuit technology development
ADVANCED MICRO DEVICES INC0 citations50
US6766265B2Jul 20, 2004
Processing tester information by trellising in integrated circuit technology development
ADVANCED MICRO DEVICES INC0 citations50
US7099789B1Aug 29, 2006
Characterizing distribution signatures in integrated circuit technology
ADVANCED MICRO DEVICES INC1 citations47