Inventor
BACKHAUSEN ULRICH
DE22 patents
⚠️ This page may combine multiple inventors who share the name “BACKHAUSEN ULRICH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
11 patentsUS9450613B2Sep 20, 2016
Apparatus and method for error correction and error detection
INFINEON TECHNOLOGIES AG7 citations83
US10599350B2Mar 24, 2020
Using a differential memory storage architecture for updating a memory area
INFINEON TECHNOLOGIES AG2 citations73
US10319460B2Jun 11, 2019
Systems and methods utilizing a flexible read reference for a dynamic read window
INFINEON TECHNOLOGIES AG6 citations72
US10056145B2Aug 21, 2018
Resistive memory transition monitoring
INFINEON TECHNOLOGIES AG4 citations72
US10200065B2Feb 5, 2019
Apparatus and method for correcting at least one bit error within a coded bit sequence
INFINEON TECHNOLOGIES AG3 citations71
US12524335B2Jan 13, 2026
Data processing device
INFINEON TECHNOLOGIES AG0 citations57
US10067826B2Sep 4, 2018
Marker programming in non-volatile memories
INFINEON TECHNOLOGIES AG1 citations52
US9405618B2Aug 2, 2016
Marker programming in non-volatile memories
INFINEON TECHNOLOGIES AG0 citations52
US10311955B2Jun 4, 2019
Resistive memory transition monitoring
INFINEON TECHNOLOGIES AG0 citations51
US9343179B2May 17, 2016
Word line address scan
INFINEON TECHNOLOGIES AG0 citations51
US9569354B2Feb 14, 2017
System and method to emulate an electrically erasable programmable read-only memory
INFINEON TECHNOLOGIES AG0 citations48
KERN THOMAS
6 patentsUS9203437B2Dec 1, 2015
Circuitry and method for correcting 3-bit errors containing adjacent 2-bit error
KERN THOMAS6 citations72
US8539321B2Sep 17, 2013
Apparatus and method for correcting at least one bit error within a coded bit sequence
KERN THOMAS2 citations60
US9389999B2Jul 12, 2016
System and method for emulating an EEPROM in a non-volatile memory device
KERN THOMAS1 citations51
US8966355B2Feb 24, 2015
Apparatus and method for comparing pairs of binary words
KERN THOMAS0 citations51
US8856629B2Oct 7, 2014
Device and method for testing a circuit to be tested
KERN THOMAS1 citations51
US8898535B2Nov 25, 2014
Apparatus and method for detecting an error within a coded binary word
KERN THOMAS0 citations41