Inventor

TOMISHIMA SHIGEKI

JP146 patents

⚠️ This page may combine multiple inventors who share the name “TOMISHIMA SHIGEKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOMISHIMA SHIGEKI

MITSUBISHI ELECTRIC CORP

Memory system for synchronized and high speed data transfer

Synchronous semiconductor memory device allowing control of operation mode in accordance with operation conditions of a system

Semiconductor memory device

Synchronous semiconductor memory device allowing control of operation mode in accordance with operation conditions of a system

Synchronous semiconductor memory device allowing control of operation mode in accordance with operation conditions of a system

Multi-bank semiconductor memory device suitable for integration with logic

Semiconductor device provided with boost circuit consuming less current

Semiconductor device including a fuse circuit in which the electric current is cut off after blowing so as to prevent voltage fall

Semiconductor device having hierarchical power supply line structure improved in operating speed

Fast accessible semiconductor memory device

Semiconductor device allowing fast sensing with a low power supply voltage

Semiconductor memory device

Synchronous semiconductor memory device having redundant circuit of high repair efficiency and allowing high speed access

Step-up potential supply circuit and semiconductor storage device

Column selecting circuit in semiconductor memory device

Arrangement of power supply and data input/output pads in semiconductor memory device

Dynamic semiconductor memory device with SOI structure and body refresh circuitry

Semiconductor memory device

Dynamic semiconductor memory device having excellent charge retention characteristics

Arrangement of power supply and data input/output pads in semiconductor memory device

Semiconductor memory device having power line arranged in a meshed shape

Layout of a semiconductor memory device

Synchronous semiconductor integrated circuit device capable of test time reduction

Fast accessible semiconductor memory device

Antifuse address detecting circuit programmable by applying a high voltage and semiconductor integrated circuit device provided with the same

Synchronous semiconductor memory device capable of performing operation test at high speed while reducing burden on tester

Semiconductor memory device

Dynamic semiconductor memory device having excellent charge retention characteristics

Signal potential conversion circuit

Semiconductor memory device with readily changeable memory capacity

Synchronous semiconductor memory device having redundant circuit of high repair efficiency and allowing high speed access

Boosted-voltage drive circuit operable with high reliability and semiconductor memory device employing the same

Semiconductor integrated circuit device with large internal bus width, including memory and logic circuit

Semiconductor device with antifuse

Synchronous semiconductor memory device suitable for merging with logic

Semiconductor memory device having multiple global I/O line pairs

Dynamic semiconductor memory device having excellent charge retention characteristics

Semiconductor memory device implementing multi-bank configuration with reduced number of signal lines

Synchronous semiconductor memory device capable of reducing power dissipation by suppressing leakage current during stand-by and in active operation

Semiconductor memory device

Semiconductor integrated circuit device comprising synchronous DRAM core and logic circuit integrated into a single chip and method of testing the synchronous DRAM core

Dynamic semiconductor memory device having excellent charge retention characteristics

Semiconductor memory device having power line arranged in a meshed shape

Dynamic random access memory having an internal circuit using a boosted potential

INTEL CORP

Hidden refresh control in dynamic random access memory

Bitcell state retention

Supply-switched dual cell memory bitcell

Apparatus, system and method for determining comparison information based on memory data

RENESAS TECH CORP

Semiconductor device suitable for system in package

Semiconductor device suitable for system in package