Inventor
KEMERLING CLINT L
US26 patents
⚠️ This page may combine multiple inventors who share the name “KEMERLING CLINT L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PSEMI CORP
17 patentsUS10680600B2Jun 9, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP21 citations98
US10622990B2Apr 14, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP20 citations98
US10153763B2Dec 11, 2018
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP24 citations98
US10790815B2Sep 29, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP11 citations94
US10797691B1Oct 6, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP10 citations93
US10797690B2Oct 6, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP10 citations93
US10790814B2Sep 29, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP10 citations93
US10784855B2Sep 22, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP10 citations93
US10797172B2Oct 6, 2020
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
PSEMI CORP10 citations92
US10818796B2Oct 27, 2020
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PSEMI CORP11 citations86
US11967948B2Apr 23, 2024
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP0 citations73
US11901459B2Feb 13, 2024
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PSEMI CORP2 citations73
US11362652B2Jun 14, 2022
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PSEMI CORP0 citations73
USRE48944EFeb 22, 2022
Method and apparatus for use in improving linearity of MOSFETS using an accumulated charge sink
PSEMI CORP0 citations73
US11201245B2Dec 14, 2021
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PSEMI CORP2 citations73
US12520525B2Jan 6, 2026
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PSEMI CORP0 citations62
USRE48965EMar 8, 2022
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PSEMI CORP0 citations62
PEREGRINE SEMICONDUCTOR CORP
6 patentsUS7910993B2Mar 22, 2011
Method and apparatus for use in improving linearity of MOSFET's using an accumulated charge sink
PEREGRINE SEMICONDUCTOR CORP280 citations99
US7890891B2Feb 15, 2011
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PEREGRINE SEMICONDUCTOR CORP141 citations99
US9780775B2Oct 3, 2017
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PEREGRINE SEMICONDUCTOR CORP32 citations98
US9608619B2Mar 28, 2017
Method and apparatus improving gate oxide reliability by controlling accumulated charge
PEREGRINE SEMICONDUCTOR CORP35 citations98
US9130564B2Sep 8, 2015
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
PEREGRINE SEMICONDUCTOR CORP35 citations98
US7619462B2Nov 17, 2009
Unpowered switch and bleeder circuit
PEREGRINE SEMICONDUCTOR CORP64 citations98
BRINDLE CHRISTOPHER N
2 patentsUS8405147B2Mar 26, 2013
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
BRINDLE CHRISTOPHER N58 citations98
US8129787B2Mar 6, 2012
Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink
BRINDLE CHRISTOPHER N101 citations98