P

Inventor

WELSTAND ROBERT B

US29 patents
⚠️ This page may combine multiple inventors who share the name “WELSTAND ROBERT B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PSEMI CORP

16 patents
US10680600B2Jun 9, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP21 citations98
US10622990B2Apr 14, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP20 citations98
US10790815B2Sep 29, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP11 citations94
US10797691B1Oct 6, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP10 citations93
US10797690B2Oct 6, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP10 citations93
US10790814B2Sep 29, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP10 citations93
US10784855B2Sep 22, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP10 citations93
US10797172B2Oct 6, 2020

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction

PSEMI CORP10 citations92
US10818796B2Oct 27, 2020

Method and apparatus improving gate oxide reliability by controlling accumulated charge

PSEMI CORP11 citations86
US11967948B2Apr 23, 2024

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP0 citations73
US11901459B2Feb 13, 2024

Method and apparatus improving gate oxide reliability by controlling accumulated charge

PSEMI CORP2 citations73
US11362652B2Jun 14, 2022

Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink

PSEMI CORP0 citations73
USRE48944EFeb 22, 2022

Method and apparatus for use in improving linearity of MOSFETS using an accumulated charge sink

PSEMI CORP0 citations73
US11201245B2Dec 14, 2021

Method and apparatus improving gate oxide reliability by controlling accumulated charge

PSEMI CORP2 citations73
US12520525B2Jan 6, 2026

Method and apparatus improving gate oxide reliability by controlling accumulated charge

PSEMI CORP0 citations62
USRE48965EMar 8, 2022

Method and apparatus improving gate oxide reliability by controlling accumulated charge

PSEMI CORP0 citations62

PEREGRINE SEMICONDUCTOR CORP

4 patents

APPLIED MICRO CIRCUITS CORP

4 patents

BRINDLE CHRISTOPHER N

2 patents

VEO INC

2 patents

VEO PHOTONICS INC

1 patent