Inventor
CURRIE MATTHEW T
US84 patents
⚠️ This page may combine multiple inventors who share the name “CURRIE MATTHEW T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AMBERWAVE SYSTEMS CORP
26 patentsUS7420201B2Sep 2, 2008
Strained-semiconductor-on-insulator device structures with elevated source/drain regions
AMBERWAVE SYSTEMS CORP80 citations99
US7074623B2Jul 11, 2006
Methods of forming strained-semiconductor-on-insulator finFET device structures
AMBERWAVE SYSTEMS CORP226 citations99
US6995430B2Feb 7, 2006
Strained-semiconductor-on-insulator device structures
AMBERWAVE SYSTEMS CORP485 citations99
US6960781B2Nov 1, 2005
Shallow trench isolation process
AMBERWAVE SYSTEMS CORP223 citations99
US7638842B2Dec 29, 2009
Lattice-mismatched semiconductor structures on insulators
AMBERWAVE SYSTEMS CORP81 citations98
US7504704B2Mar 17, 2009
Shallow trench isolation process
AMBERWAVE SYSTEMS CORP54 citations98
US7393733B2Jul 1, 2008
Methods of forming hybrid fin field-effect transistor structures
AMBERWAVE SYSTEMS CORP58 citations98
US7335545B2Feb 26, 2008
Control of strain in device layers by prevention of relaxation
AMBERWAVE SYSTEMS CORP118 citations98
US7307273B2Dec 11, 2007
Control of strain in device layers by selective relaxation
AMBERWAVE SYSTEMS CORP86 citations98
US7109516B2Sep 19, 2006
Strained-semiconductor-on-insulator finFET device structures
AMBERWAVE SYSTEMS CORP100 citations98
US7626246B2Dec 1, 2009
Solutions for integrated circuit integration of alternative active area materials
AMBERWAVE SYSTEMS CORP121 citations97
US7217603B2May 15, 2007
Methods of forming reacted conductive gate electrodes
AMBERWAVE SYSTEMS CORP41 citations96
US7138310B2Nov 21, 2006
Semiconductor devices having strained dual channel layers
AMBERWAVE SYSTEMS CORP60 citations96
US6982474B2Jan 3, 2006
Reacted conductive gate electrodes
AMBERWAVE SYSTEMS CORP28 citations96
US6991972B2Jan 31, 2006
Gate material for semiconductor device fabrication
AMBERWAVE SYSTEMS CORP49 citations95
US7588994B2Sep 15, 2009
Methods for forming strained-semiconductor-on-insulator device structures by mechanically inducing strain
AMBERWAVE SYSTEMS CORP17 citations93
US7297612B2Nov 20, 2007
Methods for forming strained-semiconductor-on-insulator device structures by use of cleave planes
AMBERWAVE SYSTEMS CORP16 citations93
US7259388B2Aug 21, 2007
Strained-semiconductor-on-insulator device structures
AMBERWAVE SYSTEMS CORP18 citations93
US7071014B2Jul 4, 2006
Methods for preserving strained semiconductor substrate layers during CMOS processing
AMBERWAVE SYSTEMS CORP27 citations93
US7566606B2Jul 28, 2009
Methods of fabricating semiconductor devices having strained dual channel layers
AMBERWAVE SYSTEMS CORP19 citations92
US7041170B2May 9, 2006
Method of producing high quality relaxed silicon germanium layers
AMBERWAVE SYSTEMS CORP14 citations92
US6891209B2May 10, 2005
Dynamic random access memory trench capacitors
AMBERWAVE SYSTEMS CORP19 citations92
US7432139B2Oct 7, 2008
Methods for forming dielectrics and metal electrodes
AMBERWAVE SYSTEMS CORP18 citations84
US7138649B2Nov 21, 2006
Dual-channel CMOS transistors with differentially strained channels
AMBERWAVE SYSTEMS CORP19 citations84
US7332417B2Feb 19, 2008
Semiconductor structures with structural homogeneity
AMBERWAVE SYSTEMS CORP13 citations80
US7414259B2Aug 19, 2008
Strained germanium-on-insulator device structures
AMBERWAVE SYSTEMS CORP4 citations74
TAIWAN SEMICONDUCTOR MFG
15 patentsUS8629477B2Jan 14, 2014
Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
TAIWAN SEMICONDUCTOR MFG35 citations98
US9064930B2Jun 23, 2015
Methods for forming semiconductor device structures
TAIWAN SEMICONDUCTOR MFG7 citations93
US8026534B2Sep 27, 2011
III-V semiconductor device structures
TAIWAN SEMICONDUCTOR MFG10 citations93
US7838392B2Nov 23, 2010
Methods for forming III-V semiconductor device structures
TAIWAN SEMICONDUCTOR MFG17 citations93
US7829442B2Nov 9, 2010
Semiconductor heterostructures having reduced dislocation pile-ups and related methods
TAIWAN SEMICONDUCTOR MFG26 citations93
US7776697B2Aug 17, 2010
Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same
TAIWAN SEMICONDUCTOR MFG9 citations93
US8796734B2Aug 5, 2014
Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
TAIWAN SEMICONDUCTOR MFG16 citations92
US8519436B2Aug 27, 2013
Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
TAIWAN SEMICONDUCTOR MFG17 citations92
US9293582B2Mar 22, 2016
Hybrid fin field-effect transistor structures and related methods
TAIWAN SEMICONDUCTOR MFG4 citations84
US9018055B2Apr 28, 2015
Hybrid fin field-effect transistor structures and related methods
TAIWAN SEMICONDUCTOR MFG4 citations84
US9219112B2Dec 22, 2015
Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
TAIWAN SEMICONDUCTOR MFG3 citations74
US8987028B2Mar 24, 2015
Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
TAIWAN SEMICONDUCTOR MFG3 citations74
US8722495B2May 13, 2014
Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same
TAIWAN SEMICONDUCTOR MFG2 citations74
US8344355B2Jan 1, 2013
Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same
TAIWAN SEMICONDUCTOR MFG3 citations74
US7846802B2Dec 7, 2010
Semiconductor structures employing strained material layers with defined impurity gradients and methods for fabricating same
TAIWAN SEMICONDUCTOR MFG5 citations74
TAIWAN SEMICONDUCTOR MFG CO LTD
3 patentsUS9601623B2Mar 21, 2017
Methods for forming semiconductor device structures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations84
US9431243B2Aug 30, 2016
Lattice-mismatched semiconductor structures with reduced dislocation defect densities and related methods for device fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9548236B2Jan 17, 2017
Methods of forming strained-semiconductor-on-insulator device structures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
LOCHTEFELD ANTHONY J
2 patentsCURRIE MATTHEW T
2 patentsBRAITHWAITE GLYN
1 patentLANGDO THOMAS A
1 patentShowing the top 50 of 84 patents by PatentIndex Score.