Inventor · disambiguated record
Terrance Wayne Kueper
Also filed as: KUEPER TERRANCE W · KUEPER TERRANCE WAYNE
16 granted patents·1 pending application·443 citations·filing 1983–2008
94Inventor score
Files withIBM17
Top patents by PatentIndex Score
17 records- 0197US7227183B2Polysilicon conductor width measurement for 3-dimensional FETsIBM·Filed 2004·Granted Jun 5, 2007·197 cites·11 claims
- 0297US6774734B2Ring oscillator circuit for EDRAM/DRAM performance monitoringIBM·Filed 2002·Granted Aug 10, 2004·91 cites·13 claims
- 0383US6879177B1Method and testing circuit for tracking transistor stress degradationIBM·Filed 2003·Granted Apr 12, 2005·27 cites·18 claims
- 0481US7009905B2Method and apparatus to reduce bias temperature instability (BTI) effectsIBM·Filed 2003·Granted Mar 7, 2006·29 cites·42 claims
- 0581US4553047ARegulator for substrate voltage generatorIBM·Filed 1983·Granted Nov 12, 1985·31 cites·5 claims
- 0679US7338818B2Systems and arrangements to assess thermal performanceIBM·Filed 2005·Granted Mar 4, 2008·11 cites·20 claims
- 0775US7241649B2FinFET body contact structureIBM·Filed 2004·Granted Jul 10, 2007·18 cites·14 claims
- 0872US7541829B1Method for correcting for asymmetry of threshold voltage shiftsIBM·Filed 2008·Granted Jun 2, 2009·6 cites·1 claims
- 0969US7734444B2Systems and arrangements to assess thermal performanceIBM·Filed 2007·Granted Jun 8, 2010·6 cites·18 claims
- 1068US7696565B2FinFET body contact structureIBM·Filed 2007·Granted Apr 13, 2010·3 cites·5 claims
- 1165US7184924B1Method, apparatus and computer program product for implementing thermal integrity screeningIBM·Filed 2005·Granted Feb 27, 2007·7 cites·16 claims
- 1260US7317605B2Method and apparatus for improving performance margin in logic pathsIBM·Filed 2004·Granted Jan 8, 2008·11 cites·8 claims
- 1353US7935629B2Semiconductor scheme for reduced circuit area in a simplified processIBM·Filed 2007·Granted May 3, 2011·0 cites·3 claims
- 1453US7626220B2Semiconductor scheme for reduced circuit area in a simplified processIBM·Filed 2007·Granted Dec 1, 2009·0 cites·1 claims
- 1550US2007128740A1Polysilicon Conductor Width Measurement for 3-Dimensional FETsIBM·Filed 2007·Application pending·0 cites
- 1649US7317217B2Semiconductor scheme for reduced circuit area in a simplified processIBM·Filed 2004·Granted Jan 8, 2008·2 cites·7 claims
- 1736US6198316B1CMOS off-chip driver circuitIBM·Filed 1999·Granted Mar 6, 2001·4 cites·12 claims
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