Inventor

ABRAMOVITCH DANIEL Y

US23 patents

⚠️ This page may combine multiple inventors who share the name “ABRAMOVITCH DANIEL Y”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ABRAMOVITCH DANIEL Y

AGILENT TECHNOLOGIES INC

Method for rapid seeks to the measurement surface for a scanning probe microscope

Providing a topographic signal of sample using atomic force microscope

Identifying and synchronizing permuted channels in a parallel channel bit error rate tester

Method for finding species peaks in mass spectrometry

Coherent demodulation with reduced latency adapted for use in scanning probe microscopes

Automatic generation of PID parameters for a scanning probe microscope

Method for improving scanning probe microscope imaging by inverse filtering

Nano position sensing and surface estimation in scanning probe microscopes using reference estimation

Method of and system for constructing valid data for memory-based tests

Cascaded digital filters with reduced latency

System for nano position sensing in scanning probe microscopes using an estimator

HEWLETT PACKARD DEVELOPMENT CO

Harmonic correction in phase-locked loops

Re-writable optical disk having reference clock information permanently formed on the disk

Re-writable optical disk having reference clock information permanently formed on the disk

Harmonic correction in phase-locked loops

HEWLETT PACKARD CO

Method and apparatus for decomposing drive error signal noise sources

Re-writable optical disk having reference clock information permanently formed on the disk

Missing pulse detector using synchronous detection

ABRAMOVITCH DANIEL Y

Automatic tuning of atomic force microscope

Re-writable optical disk having reference clock information permanently formed on the disk

Re-writable optical disk having reference clock information permanently formed on the disk

(unassigned)

Rejection of disturbances on a disk drive by use of an accelerometer

Determination of open loop responses from closed loop measurements