P

Inventor

SUMA KATSUHIRO

JP24 patents
⚠️ This page may combine multiple inventors who share the name “SUMA KATSUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

19 patents
US6384445B1May 7, 2002

Semiconductor memory device including memory cell transistors formed on SOI substrate and having fixed body regions

MITSUBISHI ELECTRIC CORP179 citations99
US6018172AJan 25, 2000

Semiconductor memory device including memory cell transistors formed on SOI substrate and having fixed body regions

MITSUBISHI ELECTRIC CORP234 citations99
US5652725AJul 29, 1997

Semiconductor memory device having a redundant row and a redundant column which can be accessed prior to substitution

MITSUBISHI ELECTRIC CORP112 citations98
USRE36089EFeb 9, 1999

Column selecting circuit in semiconductor memory device

MITSUBISHI ELECTRIC CORP52 citations96
US5825696AOct 20, 1998

Semiconductor memory device including an SOI substrate

MITSUBISHI ELECTRIC CORP33 citations96
US5635744AJun 3, 1997

Semiconductor memory and semiconductor device having SOI structure

MITSUBISHI ELECTRIC CORP52 citations96
US6586803B2Jul 1, 2003

Semiconductor device using an SOI substrate

MITSUBISHI ELECTRIC CORP31 citations93
US6385159B2May 7, 2002

Semiconductor memory device including an SOI substrate

MITSUBISHI ELECTRIC CORP14 citations93
US6288949B1Sep 11, 2001

Semiconductor memory device including an SOI substrate

MITSUBISHI ELECTRIC CORP20 citations93
US5982005ANov 9, 1999

Semiconductor device using an SOI substrate

MITSUBISHI ELECTRIC CORP20 citations93
US5315548AMay 24, 1994

Column selecting circuit in semiconductor memory device

MITSUBISHI ELECTRIC CORP20 citations93
US5793685AAug 11, 1998

Semiconductor memory device capable of simultaneously designating multibit test mode and special test mode

MITSUBISHI ELECTRIC CORP34 citations92
US5770964AJun 23, 1998

Arrangement enabling pin contact test of a semiconductor device having clamp protection circuit, and method of testing a semiconductor device

MITSUBISHI ELECTRIC CORP38 citations92
US6577522B2Jun 10, 2003

Semiconductor memory device including an SOI substrate

MITSUBISHI ELECTRIC CORP8 citations82
US6091647AJul 18, 2000

Semiconductor memory device including an SOI substrate

MITSUBISHI ELECTRIC CORP11 citations82
US5400290AMar 21, 1995

Semiconductor device allowing accurate characteristics test

MITSUBISHI ELECTRIC CORP19 citations81
US6060738AMay 9, 2000

Semiconductor device having SOI structure

MITSUBISHI ELECTRIC CORP11 citations74
US5773865AJun 30, 1998

Semiconductor memory and semiconductor device having SOI structure

MITSUBISHI ELECTRIC CORP9 citations74
US5512501AApr 30, 1996

Method of manufacturing a semiconductor device having an SOI structure

MITSUBISHI ELECTRIC CORP7 citations74

RENESAS TECH CORP

4 patents

MITSUBHISHI DENKI K K

1 patent