Inventor
SUMA KATSUHIRO
JP24 patents
⚠️ This page may combine multiple inventors who share the name “SUMA KATSUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
19 patentsUS6384445B1May 7, 2002
Semiconductor memory device including memory cell transistors formed on SOI substrate and having fixed body regions
MITSUBISHI ELECTRIC CORP179 citations99
US6018172AJan 25, 2000
Semiconductor memory device including memory cell transistors formed on SOI substrate and having fixed body regions
MITSUBISHI ELECTRIC CORP234 citations99
US5652725AJul 29, 1997
Semiconductor memory device having a redundant row and a redundant column which can be accessed prior to substitution
MITSUBISHI ELECTRIC CORP112 citations98
USRE36089EFeb 9, 1999
Column selecting circuit in semiconductor memory device
MITSUBISHI ELECTRIC CORP52 citations96
US5825696AOct 20, 1998
Semiconductor memory device including an SOI substrate
MITSUBISHI ELECTRIC CORP33 citations96
US5635744AJun 3, 1997
Semiconductor memory and semiconductor device having SOI structure
MITSUBISHI ELECTRIC CORP52 citations96
US6586803B2Jul 1, 2003
Semiconductor device using an SOI substrate
MITSUBISHI ELECTRIC CORP31 citations93
US6385159B2May 7, 2002
Semiconductor memory device including an SOI substrate
MITSUBISHI ELECTRIC CORP14 citations93
US6288949B1Sep 11, 2001
Semiconductor memory device including an SOI substrate
MITSUBISHI ELECTRIC CORP20 citations93
US5982005ANov 9, 1999
Semiconductor device using an SOI substrate
MITSUBISHI ELECTRIC CORP20 citations93
US5315548AMay 24, 1994
Column selecting circuit in semiconductor memory device
MITSUBISHI ELECTRIC CORP20 citations93
US5793685AAug 11, 1998
Semiconductor memory device capable of simultaneously designating multibit test mode and special test mode
MITSUBISHI ELECTRIC CORP34 citations92
US5770964AJun 23, 1998
Arrangement enabling pin contact test of a semiconductor device having clamp protection circuit, and method of testing a semiconductor device
MITSUBISHI ELECTRIC CORP38 citations92
US6577522B2Jun 10, 2003
Semiconductor memory device including an SOI substrate
MITSUBISHI ELECTRIC CORP8 citations82
US6091647AJul 18, 2000
Semiconductor memory device including an SOI substrate
MITSUBISHI ELECTRIC CORP11 citations82
US5400290AMar 21, 1995
Semiconductor device allowing accurate characteristics test
MITSUBISHI ELECTRIC CORP19 citations81
US6060738AMay 9, 2000
Semiconductor device having SOI structure
MITSUBISHI ELECTRIC CORP11 citations74
US5773865AJun 30, 1998
Semiconductor memory and semiconductor device having SOI structure
MITSUBISHI ELECTRIC CORP9 citations74
US5512501AApr 30, 1996
Method of manufacturing a semiconductor device having an SOI structure
MITSUBISHI ELECTRIC CORP7 citations74
RENESAS TECH CORP
4 patentsUS7138684B2Nov 21, 2006
Semiconductor memory device including an SOI substrate
RENESAS TECH CORP15 citations93
US6768662B2Jul 27, 2004
Semiconductor memory device including an SOI substrate
RENESAS TECH CORP10 citations82
US6787853B2Sep 7, 2004
Semiconductor device using an SOI substrate
RENESAS TECH CORP11 citations74
US7242060B2Jul 10, 2007
Semiconductor memory device including an SOI substrate
RENESAS TECH CORP2 citations63