P

Inventor

OHNO HIROKI

JP43 patents
⚠️ This page may combine multiple inventors who share the name “OHNO HIROKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO ELECTRON LTD

23 patents
US7806989B2Oct 5, 2010

Substrate processing method and substrate processing apparatus

TOKYO ELECTRON LTD24 citations92
US6800546B2Oct 5, 2004

Film forming method by radiating a plasma on a surface of a low dielectric constant film

TOKYO ELECTRON LTD20 citations92
US6513537B1Feb 4, 2003

Substrate processing method and substrate processing apparatus

TOKYO ELECTRON LTD20 citations92
US5830280ANov 3, 1998

Washing liquid for post-polishing and polishing-cleaning method in semiconductor process

TOKYO ELECTRON LTD33 citations92
US6536452B1Mar 25, 2003

Processing apparatus and processing method

TOKYO ELECTRON LTD28 citations90
US7837804B2Nov 23, 2010

Substrate cleaning method, substrate cleaning equipment, computer program, and program recording medium

TOKYO ELECTRON LTD10 citations84
US10115609B2Oct 30, 2018

Separation and regeneration apparatus and substrate processing apparatus

TOKYO ELECTRON LTD6 citations73
US10046370B2Aug 14, 2018

Substrate processing apparatus, substrate processing method, fluid supplying method and storage medium

TOKYO ELECTRON LTD3 citations73
US9662685B2May 30, 2017

Substrate processing apparatus, substrate processing method, fluid supplying method and storage medium

TOKYO ELECTRON LTD5 citations73
US9583330B2Feb 28, 2017

Supercritical drying method for semiconductor substrate and supercritical drying apparatus

TOKYO ELECTRON LTD2 citations73
US10923368B2Feb 16, 2021

Substrate processing apparatus, substrate processing method, and storage medium

TOKYO ELECTRON LTD3 citations72
US9881784B2Jan 30, 2018

Substrate processing method, substrate processing apparatus, and storage medium

TOKYO ELECTRON LTD4 citations72
US10950465B2Mar 16, 2021

Method of cleaning substrate processing apparatus and system of cleaning substrate processing apparatus

TOKYO ELECTRON LTD3 citations71
US10692739B2Jun 23, 2020

Substrate processing apparatus

TOKYO ELECTRON LTD2 citations71
US10504718B2Dec 10, 2019

Substrate processing apparatus, substrate processing method, and storage medium

TOKYO ELECTRON LTD5 citations71
US10395950B2Aug 27, 2019

Substrate processing apparatus, substrate processing method, and recording medium

TOKYO ELECTRON LTD5 citations71
US12198947B2Jan 14, 2025

Substrate cleaning method and substrate cleaning device

TOKYO ELECTRON LTD0 citations62
US10651061B2May 12, 2020

Substrate processing apparatus, substrate processing method and recording medium

TOKYO ELECTRON LTD1 citations62
US10207349B2Feb 19, 2019

High-pressure container, substrate processing apparatus, and method for manufacturing high-pressure container

TOKYO ELECTRON LTD1 citations62
US8794250B2Aug 5, 2014

Substrate processing method and substrate processing apparatus

TOKYO ELECTRON LTD3 citations62
US7803230B2Sep 28, 2010

Substrate cleaning apparatus, substrate cleaning method, and medium for recording program used for the method

TOKYO ELECTRON LTD5 citations62
US6895979B2May 24, 2005

Processing apparatus and processing method

TOKYO ELECTRON LTD2 citations60
US7767006B2Aug 3, 2010

Ozone processing apparatus and ozone processing method

TOKYO ELECTRON LTD1 citations51

UNIDEN KK

3 patents

KITZ CORP

2 patents

SEKIGUCHI KENJI

2 patents

OHNO HIROKI

2 patents

TOSHIBA KK

2 patents

ORII TAKEHIKO

1 patent

TOPPAN FORMS CO LTD

1 patent

JI LINAN

1 patent

ADVANCED DISPLAY KK

1 patent

UNIDEN AMERICA CORP

1 patent

HAYASHI HIDEKAZU

1 patent

WATANABE TSUKASA

1 patent

NEC ELECTRONICS CORP

1 patent

GOUSHI KAISHA TOUKURIKI SHOTEN

1 patent