US10395950B2ActiveUtilityA1

Substrate processing apparatus, substrate processing method, and recording medium

85
Assignee: TOKYO ELECTRON LTDPriority: Nov 4, 2016Filed: Nov 2, 2017Granted: Aug 27, 2019
Est. expiryNov 4, 2036(~10.3 yrs left)· nominal 20-yr term from priority
H10P 72/0414H10P 70/80H10P 70/20H10P 72/0408H10P 72/0411H10P 70/15H10P 72/0448B08B 7/0021B01J 3/06B01J 3/008H01L 21/02057H01L 21/67034H01L 21/02101H01L 21/67051
85
PatentIndex Score
5
Cited by
10
References
10
Claims

Abstract

A substrate processing apparatus performs: a pressure raising process of raising a pressure within the processing container to a processing pressure higher than a critical pressure of the processing fluid, after the substrate is accommodated in the processing container; and a circulation process of supplying the processing fluid to the processing container and discharging the processing fluid from the processing container while keeping a pressure at which the processing fluid is maintained in the supercritical state, within the processing container. In the pressure raising process, the supply of the processing fluid from the second fluid supply unit is stopped and the processing fluid is supplied from the first fluid supply unit into the processing container until at least the pressure within the processing container reaches the critical pressure. In the circulation process, the processing fluid is supplied into the processing container from the second fluid supply unit.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
       1. A substrate processing apparatus for drying a substrate having a liquid adhering to a surface thereof, using a processing fluid in a supercritical state, the substrate processing apparatus comprising:
 a processing container; 
 a substrate holder configured to horizontally hold the substrate within the processing container in a state in which the surface of the substrate is directed upwards; 
 a first fluid supply unit provided below the substrate held by the substrate holder, and configured to supply a pressurized processing fluid; 
 a second fluid supply unit provided at a side of the substrate held by the substrate holder, and configured to supply a pressurized processing fluid; 
 a fluid discharge unit configured to discharge a processing fluid from the processing container; and 
 a controller configured to control operations of the first fluid supply unit, the second fluid supply unit, and the fluid discharge unit, 
 wherein the controller causes the substrate processing apparatus to execute: 
 a pressure raising process of supplying the pressurized processing fluid to the processing container so as to raise a pressure within the processing container to a processing pressure higher than a critical pressure of the processing fluid, after the substrate having the liquid adhering to the surface thereof is accommodated in the processing container; and 
 a circulation process of supplying the processing fluid to the processing container and discharging the processing fluid from the processing container while keeping a pressure at which at least the processing fluid is maintained in the supercritical state, within the processing container, and 
 wherein in the pressure raising process, the controller causes a supply of the processing fluid from the second fluid supply unit to be stopped and the processing fluid to be supplied from the first fluid supply unit into the processing container until at least the pressure within the processing container reaches the critical pressure of the processing fluid, and 
 in the circulation process, the controller causes the processing fluid to be supplied into the processing container from the second fluid supply unit. 
 
     
     
       2. The substrate processing apparatus of  claim 1 , wherein, in the pressure raising process, the controller causes the supply of the processing fluid from the second fluid supply unit to be stopped and the processing fluid to be supplied from the first fluid supply unit into the processing container until the pressure within the processing container reaches the processing pressure via the critical pressure from a point in time when the supply of the processing fluid into the processing container starts. 
     
     
       3. The substrate processing apparatus of  claim 1 , wherein, in the pressure raising process, the controller causes the supply of the processing fluid from the second fluid supply unit to be stopped and the processing fluid to be supplied from the first fluid supply unit into the processing container until the pressure within the processing container reaches the critical pressure of the processing fluid from a point in time when a supply of the processing fluid into the processing container starts, and causes the supply of the processing fluid from the first fluid supply unit to be stopped and the processing fluid to be supplied from the second fluid supply unit into the processing container, or the processing fluid to be supplied from both the first and second fluid supply units into the processing container, until the pressure within the processing container reaches the processing pressure after reaching the critical pressure of the processing fluid. 
     
     
       4. The substrate processing apparatus of  claim 1 , wherein the first fluid supply unit is provided to supply the processing fluid from a position below a central portion of the substrate held by the substrate holder, toward the central portion of the substrate. 
     
     
       5. The substrate processing apparatus of  claim 1 , wherein the second fluid supply unit is provided to supply the processing fluid from a side of the substrate substantially in a horizontal direction. 
     
     
       6. The substrate processing apparatus of  claim 5 , wherein the second fluid supply unit is provided to supply the processing fluid in parallel to the substrate from a position higher than an upper surface of the substrate, at the side of the substrate. 
     
     
       7. A substrate processing method comprising:
 accommodating a substrate having a pattern formed on a surface thereof and a liquid adhering to the surface, in a processing container; 
 raising a pressure within the processing container to a processing pressure higher than a critical pressure of the processing fluid by supplying a pressurized processing fluid to the processing container; and 
 performing a circulation process of supplying the pressurized processing fluid to the processing container and discharging the processing fluid from the processing container while keeping a pressure at which at least the processing fluid is maintained in a supercritical state, within the processing container, 
 wherein, in the raising the pressure, the pressurized processing fluid is supplied from a first fluid supply unit provided below the substrate until at least the pressure within the processing container reaches the critical pressure of the processing fluid, 
 in the performing the circulation process, the pressurized processing fluid is supplied from a second fluid supply unit provided at a side of the substrate, and 
 in the raising the pressure, the pressurized processing fluid is not supplied from the second fluid supply unit until at least the pressure within the processing container reaches the critical pressure of the processing fluid. 
 
     
     
       8. The substrate processing method of  claim 7 , wherein, in the raising the pressure, the processing fluid is supplied into the processing container using the first fluid supply unit without using the second fluid supply unit until the pressure within the processing container reaches the processing pressure via the critical pressure from a point in time when the supply of the processing fluid into the processing container starts. 
     
     
       9. The substrate processing method of  claim 8 , wherein, in the raising the pressure, the processing fluid is supplied into the processing container using the first fluid supply unit without using the second fluid supply unit until the pressure within the processing container reaches the critical pressure of the processing fluid from a point in time when a supply of the processing fluid into the processing container starts, and
 the processing fluid is supplied into the processing container using the second fluid supply unit without using the first fluid supply unit or the processing fluid is supplied into the processing container using both the first and second fluid supply units until the pressure within the processing container reaches the processing pressure after reaching the critical pressure of the processing fluid. 
 
     
     
       10. A non-transitory computer-readable storage medium storing a computer-executable program that, when executed, causes a computer to control a substrate processing apparatus to execute the substrate processing method of  claim 7 .

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