Inventor
WANG SZU-YU
TW45 patents
⚠️ This page may combine multiple inventors who share the name “WANG SZU-YU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
30 patentsUS10276513B2Apr 30, 2019
Integrated circuit with backside structures to reduce substrate warp
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9871095B2Jan 16, 2018
Stacked capacitor with enhanced capacitance and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9646938B2May 9, 2017
Integrated circuit with backside structures to reduce substrate warp
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9209190B2Dec 8, 2015
Deep trench capacitor
TAIWAN SEMICONDUCTOR MFG CO LTD13 citations84
US9184041B2Nov 10, 2015
Integrated circuit with backside structures to reduce substrate warp
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9754827B1Sep 5, 2017
Semiconductor device and fabrication method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US10833026B2Nov 10, 2020
Integrated circuit with backside structures to reduce substrate warp
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10497860B2Dec 3, 2019
Perpendicular magnetic random-access memory (MRAM) formation by direct self-assembly method
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10276678B2Apr 30, 2019
Semiconductor device and fabrication method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10998494B2May 4, 2021
Perpendicular magnetic random-access memory (MRAM) formation by direct self-assembly method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12471379B2Nov 11, 2025
Multi-function substrate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12218184B2Feb 4, 2025
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12113071B2Oct 8, 2024
Multi-function substrate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12046649B2Jul 23, 2024
Method for forming semiconductor structure for memory device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11735635B2Aug 22, 2023
Semiconductor device and fabrication method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11588031B2Feb 21, 2023
Semiconductor structure for memory device and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11532642B2Dec 20, 2022
Multi-function substrate
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11069785B2Jul 20, 2021
Semiconductor device and fabrication method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9401434B2Jul 26, 2016
E-flash cell band engineering for erasing speed enhancement
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US9281203B2Mar 8, 2016
Silicon dot formation by direct self-assembly method for flash memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US10777649B2Sep 15, 2020
Silicon nano-tip thin film for flash memory cells
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10170539B2Jan 1, 2019
Stacked capacitor with enhanced capacitance
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9634105B2Apr 25, 2017
Silicon nano-tip thin film for flash memory cells
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9577077B2Feb 21, 2017
Well controlled conductive dot size in flash memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9385136B2Jul 5, 2016
Silicon dot formation by self-assembly method and selective silicon growth for flash memory
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US9257636B2Feb 9, 2016
Perpendicular magnetic random-access memory (MRAM) formation by direct self-assembly method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9064821B2Jun 23, 2015
Silicon dot formation by self-assembly method and selective silicon growth for flash memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9685518B2Jun 20, 2017
Method of forming semiconductor structure of control gate, and semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10497560B2Dec 3, 2019
Uniformity control for Si dot size in flash memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
US9929007B2Mar 27, 2018
e-Flash Si dot nitrogen passivation for trap reduction
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
MACRONIX INT CO LTD
10 patentsUS7688626B2Mar 30, 2010
Depletion mode bandgap engineered memory
MACRONIX INT CO LTD32 citations96
US7642585B2Jan 5, 2010
Non-volatile memory cells, memory arrays including the same and methods of operating cells and arrays
MACRONIX INT CO LTD30 citations93
US7463530B2Dec 9, 2008
Operating method of non-volatile memory device
MACRONIX INT CO LTD44 citations93
US7879738B2Feb 1, 2011
Charge trapping dielectric structure for non-volatile memory
MACRONIX INT CO LTD40 citations92
US7060594B2Jun 13, 2006
Memory device and method of manufacturing including deuterated oxynitride charge trapping structure
MACRONIX INT CO LTD49 citations92
US7772072B2Aug 10, 2010
Method for manufacturing non-volatile memory
MACRONIX INT CO LTD9 citations84
US7405125B2Jul 29, 2008
Tunnel oxynitride in flash memories
MACRONIX INT CO LTD10 citations84
US8730726B2May 20, 2014
Multi-gate bandgap engineered memory
MACRONIX INT CO LTD3 citations66
US7529137B2May 5, 2009
Methods of operating bandgap engineered memory
MACRONIX INT CO LTD4 citations63
US7314796B2Jan 1, 2008
Methods for reducing wordline sheet resistance
MACRONIX INT CO LTD1 citations52
LUE HANG-TING
4 patentsUS8315095B2Nov 20, 2012
Multi-gate bandgap engineered memory
LUE HANG-TING28 citations96
US8264028B2Sep 11, 2012
Non-volatile memory cells, memory arrays including the same and methods of operating cells and arrays
LUE HANG-TING27 citations92
US8094497B2Jan 10, 2012
Multi-gate bandgap engineered memory
LUE HANG-TING4 citations74
US8149628B2Apr 3, 2012
Operating method of non-volatile memory device
LUE HANG-TING0 citations52