P

Inventor

HSIAO CHENG-TAI

TW17 patents
⚠️ This page may combine multiple inventors who share the name “HSIAO CHENG-TAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

16 patents
US10529913B1Jan 7, 2020

Techniques for MRAM MTJ top electrode connection

TAIWAN SEMICONDUCTOR MFG CO LTD15 citations94
US10163651B1Dec 25, 2018

Structure and method to expose memory cells with different sizes

TAIWAN SEMICONDUCTOR MFG CO LTD32 citations94
US9425155B2Aug 23, 2016

Wafer bonding process and structure

TAIWAN SEMICONDUCTOR MFG CO LTD28 citations94
US10790189B2Sep 29, 2020

3D integrated circuit and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US11183627B2Nov 23, 2021

MRAM MTJ top electrode connection

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11183394B2Nov 23, 2021

Structure and method to expose memory cells with different sizes

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11152426B2Oct 19, 2021

Memory device using an etch stop dielectric layer and methods for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10128209B2Nov 13, 2018

Wafer bonding process and structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10090196B2Oct 2, 2018

3D integrated circuit and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US12290003B2Apr 29, 2025

Conductive structure connection with interconnect structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12185640B2Dec 31, 2024

MRAM MTJ with directly coupled top electrode connection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11594679B2Feb 28, 2023

Structure improving reliability of top electrode contact for resistance switching RAM having cells of varying height

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11367623B2Jun 21, 2022

Structure and method to expose memory cells with different sizes

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11121315B2Sep 14, 2021

Structure improving reliability of top electrode contact for resistance switching RAM having cells of varying height

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US10727077B2Jul 28, 2020

Structure and method to expose memory cells with different sizes

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10181441B2Jan 15, 2019

Through via structure and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41

TAIWAN SEMICONDUCTOR MFG

1 patent