Inventor · disambiguated record
Hisanori Yokura
Also filed as: YOKURA HISANORI
21 granted patents·6 pending applications·121 citations·filing 1999–2020
94Inventor score
Top patents by PatentIndex Score
27 records- 0194US8497557B2Semiconductor deviceTANAKA MASAYA·Filed 2010·Granted Jul 30, 2013·23 cites·1 claims
- 0292US7821085B2Physical quantity sensor and method for manufacturing the sameDENSO CORP·Filed 2009·Granted Oct 26, 2010·26 cites·12 claims
- 0382US9664768B2Magnetic sensorDENSO CORP·Filed 2013·Granted May 30, 2017·6 cites·30 claims
- 0482US8413507B2Semiconductor dynamic quantity sensor and method of manufacturing the sameFUJII TETSUO·Filed 2010·Granted Apr 9, 2013·7 cites·13 claims
- 0577US7644623B2Semiconductor sensor for measuring a physical quantity and method of manufacturing the sameDENSO CORP·Filed 2008·Granted Jan 12, 2010·7 cites·17 claims
- 0676US9024632B2Magnetic sensor with a plurality of heater portions to fix the direction of magnetization of a pinned magnetic layerFURUICHI TAKAMOTO·Filed 2012·Granted May 5, 2015·7 cites·38 claims
- 0774US7387024B2Capacitive type humidity sensorDENSO CORP·Filed 2005·Granted Jun 17, 2008·4 cites·11 claims
- 0869US8785231B2Method of making semiconductor deviceDENSO CORP·Filed 2013·Granted Jul 22, 2014·2 cites·16 claims
- 0967US8089144B2Semiconductor device and method for manufacturing the sameFUJII TETSUO·Filed 2009·Granted Jan 3, 2012·3 cites·22 claims
- 1063US10468322B2Semiconductor device capable of suppressing cracks of through-hole protective film and short circuit of adjacent through-electrodesDENSO CORP·Filed 2017·Granted Nov 5, 2019·1 cites·5 claims
- 1163US7157781B2Enhancement of membrane characteristics in semiconductor device with membraneDENSO CORP·Filed 2003·Granted Jan 2, 2007·11 cites·4 claims
- 1262US9349644B2Semiconductor device producing methodDENSO CORP·Filed 2013·Granted May 24, 2016·1 cites·5 claims
- 1362US8169082B2Semiconductor device and method for manufacturing the sameFUJII TETSUO·Filed 2011·Granted May 1, 2012·1 cites·4 claims
- 1460US9105753B2Semiconductor physical quantity sensor and method for manufacturing the sameDENSO CORP·Filed 2013·Granted Aug 11, 2015·1 cites·14 claims
- 1554US7071709B2Circuit for detecting capacitance change in variable capacitanceDENSO CORP·Filed 2004·Granted Jul 4, 2006·6 cites·6 claims
- 1653US2010155865A1Semiconductor device and method of making the sameDENSO CORP·Filed 2009·Application pending·0 cites
- 1749US7154094B2Fabri-Perot filterDENSO CORP·Filed 2004·Granted Dec 26, 2006·2 cites·5 claims
- 1849US2005161605A1Infrared gas sensorDENSO CORP·Filed 2004·Application pending·0 cites
- 1948US11054326B2Physical quantity sensorDENSO CORP·Filed 2019·Granted Jul 6, 2021·0 cites·5 claims
- 2048US2020095115A1Semiconductor device and method for manufacturing the sameDENSO CORP·Filed 2019·Application pending·0 cites
- 2147US6316300B1Method of manufacturing a semiconductor device having an oxidation process for selectively forming an oxide filmDENSO CORP·Filed 1999·Granted Nov 13, 2001·13 cites·20 claims
- 2247US2004188622A1Gas detection deviceDENSO CORP NIPPON SOKEN INC·Filed 2004·Application pending·0 cites
- 2347US2004177685A1Capacitance type humidity sensorDENSO CORP·Filed 2004·Application pending·0 cites
- 2445US2020399118A1Electronic deviceDENSO CORP·Filed 2020·Application pending·0 cites
- 2542US9835507B2Dynamic quantity sensorDENSO CORP·Filed 2014·Granted Dec 5, 2017·0 cites·11 claims
- 2638US8106471B2Semiconductor dynamic quantity sensor and method of producing the sameYOKURA HISANORI·Filed 2009·Granted Jan 31, 2012·0 cites·14 claims
- 2733US9944515B2Manufacturing method of semiconductor deviceDENSO CORP·Filed 2016·Granted Apr 17, 2018·0 cites·2 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →