P

Inventor

LANZILLO NICHOLAS ANTHONY

US101 patents

Patents

50 patents
US11195993B2Dec 7, 2021

Encapsulation topography-assisted self-aligned MRAM top contact

IBM7 citations84
US11152257B2Oct 19, 2021

Barrier-less prefilled via formation

IBM5 citations84
US11756887B2Sep 12, 2023

Backside floating metal for increased capacitance

IBM5 citations75
US11894265B2Feb 6, 2024

Top via with damascene line and via

IBM2 citations73
US11276639B2Mar 15, 2022

Conductive lines with subtractive cuts

IBM3 citations73
US11195795B1Dec 7, 2021

Well-controlled edge-to-edge spacing between adjacent interconnects

IBM3 citations73
US11195792B2Dec 7, 2021

Top via stack

IBM2 citations73
US11189568B2Nov 30, 2021

Top via interconnect having a line with a reduced bottom dimension

IBM2 citations73
US11171084B2Nov 9, 2021

Top via with next level line selective growth

IBM2 citations73
US11139201B2Oct 5, 2021

Top via with hybrid metallization

IBM2 citations73
US10978343B2Apr 13, 2021

Interconnect structure having fully aligned vias

IBM2 citations73
US10727124B2Jul 28, 2020

Structure and method for forming fully-aligned trench with an up-via integration scheme

IBM3 citations73
US12148682B2Nov 19, 2024

Memory cell in wafer backside

IBM2 citations72
US11908791B2Feb 20, 2024

Partial subtractive supervia enabling hyper-scaling

IBM2 citations72
US12538553B2Jan 27, 2026

Contact structure for power delivery on semiconductor device

IBM1 citations64
US12424549B2Sep 23, 2025

Skip-level TSV with hybrid dielectric scheme for backside power delivery

IBM1 citations64
US12588487B2Mar 24, 2026

Tight pitch directional selective via growth

IBM0 citations63
US12557328B2Feb 17, 2026

Vertical-transport field-effect transistor with backside source/drain connections

IBM0 citations63
US12550704B2Feb 10, 2026

Subtractive skip via

IBM0 citations63
US12550719B2Feb 10, 2026

VTFET circuit with optimized output

IBM0 citations63
US12550713B2Feb 10, 2026

Hybrid buried power rail structure with dual front side and backside processing

IBM0 citations63
US12525529B2Jan 13, 2026

Forming line end vias

IBM0 citations63
US12506080B2Dec 23, 2025

Reduced capacitance between power via bar and gates

IBM0 citations63
US12494428B2Dec 9, 2025

Airgap spacer for power via

IBM0 citations63
US12484248B2Nov 25, 2025

Source/drain contact at tight cell boundary

IBM0 citations63
US12463132B2Nov 4, 2025

Semiconductor structure with backside metallization layers

IBM0 citations63
US12463130B2Nov 4, 2025

Wrap around metal via structure

IBM0 citations63
US12463128B2Nov 4, 2025

Interconnect structures with vias having vertical and horizontal sections

IBM0 citations63
US12457793B2Oct 28, 2025

Vertical transport field effect transistor (VTFET) with backside wraparound contact

IBM0 citations63
US12439608B2Oct 7, 2025

MRAM integration with self-aligned direct back side contact

IBM0 citations63
US12424557B2Sep 23, 2025

Dual structured buried rail

IBM0 citations63
US12417963B2Sep 16, 2025

Isolation rail between backside power rails

IBM0 citations63
US12417979B2Sep 16, 2025

Pass-through wiring in notched interconnect

IBM0 citations63
US12412836B2Sep 9, 2025

Backside power plane

IBM0 citations63
US12400960B2Aug 26, 2025

Vertical-transport field-effect transistor with backside gate contact

IBM0 citations63
US12334442B2Jun 17, 2025

Dielectric caps for power and signal line routing

IBM0 citations63
US12261056B2Mar 25, 2025

Top via patterning using metal as hard mask and via conductor

IBM0 citations63
US12243819B2Mar 4, 2025

Single-mask alternating line deposition

IBM0 citations63
US12142525B2Nov 12, 2024

Self-aligning spacer tight pitch via

IBM0 citations63
US11990410B2May 21, 2024

Top via interconnect having a line with a reduced bottom dimension

IBM0 citations63
US11961759B2Apr 16, 2024

Interconnects having spacers for improved top via critical dimension and overlay tolerance

IBM0 citations63
US11908738B2Feb 20, 2024

Interconnect including integrally formed capacitor

IBM0 citations63
US11842961B2Dec 12, 2023

Advanced metal interconnects with a replacement metal

IBM0 citations63
US11823998B2Nov 21, 2023

Top via with next level line selective growth

IBM0 citations63
US11804406B2Oct 31, 2023

Top via cut fill process for line extension reduction

IBM0 citations63
US11791258B2Oct 17, 2023

Conductive lines with subtractive cuts

IBM0 citations63
US11670542B2Jun 6, 2023

Stepped top via for via resistance reduction

IBM0 citations63
US11621189B2Apr 4, 2023

Barrier-less prefilled via formation

IBM0 citations63
US11600565B2Mar 7, 2023

Top via stack

IBM0 citations63
US11437317B2Sep 6, 2022

Single-mask alternating line deposition

IBM0 citations63

Showing the top 50 of 101 patents by PatentIndex Score.