Inventor · disambiguated record
Gerald W. Back
Also filed as: BACK GERALD · BACK GERALD W
7 granted patents·2 pending applications·326 citations·filing 1997–2009
88Inventor score
Top patents by PatentIndex Score
9 records- 0192US6908364B2Method and apparatus for probe tip cleaning and shaping padKULICKE & SOFFA IND INC·Filed 2001·Granted Jun 21, 2005·71 cites·18 claims
- 0287US7364461B1Direct attachment of coaxial cablesSV PROBE PTE LTD·Filed 2007·Granted Apr 29, 2008·31 cites·6 claims
- 0386US6002426AInverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuitsCERPROBE CORP·Filed 1997·Granted Dec 14, 1999·168 cites·19 claims
- 0483US8222912B2Probe head structure for probe test cardsDANG SON N·Filed 2009·Granted Jul 17, 2012·21 cites·21 claims
- 0566US6426637B1Alignment guide and signal transmission apparatus and method for spring contact probe needlesCERPROBE CORP·Filed 1999·Granted Jul 30, 2002·28 cites·40 claims
- 0662US7679383B2Cantilever probe cardSV PROBE PTE LTD·Filed 2007·Granted Mar 16, 2010·4 cites·22 claims
- 0752US8430676B2Modular space transformer for fine pitch vertical probing applicationsDANG SON·Filed 2009·Granted Apr 30, 2013·3 cites·14 claims
- 0838US2009174423A1Bond Reinforcement Layer for Probe Test CardsKLAERNER PETER J·Filed 2009·Application pending·0 cites
- 0933US2010176831A1Probe Test Card with Flexible Interconnect StructurePALCISKO WILLIAM M·Filed 2009·Application pending·0 cites
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