Inventor
LI KUN-JU
TW41 patents
Patents
41 patentsUS10535817B1Jan 14, 2020
Method of manufacturing embedded magnetoresistive random access memory
UNITED MICROELECTRONICS CORP8 citations84
US9887158B1Feb 6, 2018
Conductive structure having an entrenched high resistive layer
UNITED MICROELECTRONICS CORP5 citations83
US9773682B1Sep 26, 2017
Method of planarizing substrate surface
UNITED MICROELECTRONICS CORP5 citations83
US10916694B2Feb 9, 2021
Magnetoresistive random access memory (MRAM) device
UNITED MICROELECTRONICS CORP2 citations73
US10446745B1Oct 15, 2019
Method of manufacturing magnetoresistive random access memory cell
UNITED MICROELECTRONICS CORP4 citations73
US9966263B1May 8, 2018
Method of fabricating fin structure
UNITED MICROELECTRONICS CORP3 citations72
US9905430B1Feb 27, 2018
Method for forming semiconductor structure
UNITED MICROELECTRONICS CORP4 citations72
US9875909B1Jan 23, 2018
Method for planarizing material layer
UNITED MICROELECTRONICS CORP3 citations72
US9735015B1Aug 15, 2017
Fabricating method of semiconductor structure
UNITED MICROELECTRONICS CORP2 citations72
US10804461B1Oct 13, 2020
Manufacturing method of memory device
UNITED MICROELECTRONICS CORP3 citations71
US9384996B2Jul 5, 2016
Method for manufacturing semiconductor device and device manufactured by the same
UNITED MICROELECTRONICS CORP4 citations71
US11257711B1Feb 22, 2022
Fabricating method of transistors without dishing occurred during CMP process
UNITED MICROELECTRONICS CORP2 citations69
US11211471B1Dec 28, 2021
Method of manufacturing a semiconductor device
UNITED MICROELECTRONICS CORP6 citations69
US12557557B2Feb 17, 2026
Method for fabricating magnetoresistive random access memory (MRAM) device
UNITED MICROELECTRONICS CORP0 citations62
US12527230B2Jan 13, 2026
Magnetoresistive random access memory device
UNITED MICROELECTRONICS CORP0 citations62
US12471498B2Nov 11, 2025
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11778922B2Oct 3, 2023
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations62
US11737370B2Aug 22, 2023
Magnetoresistive random access memory (MRAM) device
UNITED MICROELECTRONICS CORP0 citations62
US11706993B2Jul 18, 2023
Method of manufacturing magnetoresistive random access memory (MRAM) device
UNITED MICROELECTRONICS CORP0 citations62
US10722998B2Jul 28, 2020
Wafer polishing pad and using method thereof
UNITED MICROELECTRONICS CORP1 citations62
US9502303B2Nov 22, 2016
Method for manufacturing semiconductor device with a barrier layer having overhung portions
UNITED MICROELECTRONICS CORP2 citations62
US12127413B2Oct 22, 2024
Magnetoresistive random access memory and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations61
US11621296B2Apr 4, 2023
Magnetoresistive random access memory and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations61
US11004897B2May 11, 2021
Magnetoresistive random access memory and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations61
US12543548B2Feb 3, 2026
Semiconductor structure and method for forming the same
UNITED MICROELECTRONICS CORP0 citations60
US12494456B2Dec 9, 2025
Semiconductor assembly and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations59
US9466535B2Oct 11, 2016
Method of forming target patterns
UNITED MICROELECTRONICS CORP0 citations52
US10290723B2May 14, 2019
Semiconductor device with metal gate
UNITED MICROELECTRONICS CORP0 citations51
US10192826B2Jan 29, 2019
Conductive layout structure including high resistive layer
UNITED MICROELECTRONICS CORP0 citations51
US10103034B2Oct 16, 2018
Method of planarizing substrate surface
UNITED MICROELECTRONICS CORP0 citations51
US10049887B2Aug 14, 2018
Method of planarizing substrate surface
UNITED MICROELECTRONICS CORP0 citations51
US10008581B2Jun 26, 2018
Semiconductor device having metal gate with nitrogen rich portion and titanium rich portion
UNITED MICROELECTRONICS CORP0 citations51
US9673053B2Jun 6, 2017
Method for fabricating semiconductor device
UNITED MICROELECTRONICS CORP1 citations51
US9299600B2Mar 29, 2016
Method for repairing an oxide layer and method for manufacturing a semiconductor structure applying the same
UNITED MICROELECTRONICS CORP0 citations51
US11482666B2Oct 25, 2022
Method for fabricating a semiconductor device
UNITED MICROELECTRONICS CORP0 citations50
US9443726B1Sep 13, 2016
Semiconductor process
UNITED MICROELECTRONICS CORP1 citations50
US12593636B2Mar 31, 2026
Manufacturing method of semiconductor structure
UNITED MICROELECTRONICS CORP0 citations48
US11923205B2Mar 5, 2024
Method for manufacturing semiconductor device
UNITED MICROELECTRONICS CORP0 citations48
US9466484B1Oct 11, 2016
Manufacturing method of semiconductor device
UNITED MICROELECTRONICS CORP1 citations48
US11145602B2Oct 12, 2021
Alignment mark structure and method of fabricating the same
UNITED MICROELECTRONICS CORP0 citations47
US9972498B2May 15, 2018
Method of fabricating a gate cap layer
UNITED MICROELECTRONICS CORP0 citations41