Inventor
MOREAU WAYNE M
US52 patents
⚠️ This page may combine multiple inventors who share the name “MOREAU WAYNE M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
45 patentsUS6420088B1Jul 16, 2002
Antireflective silicon-containing compositions as hardmask layer
IBM214 citations98
US6503692B2Jan 7, 2003
Antireflective silicon-containing compositions as hardmask layer
IBM85 citations97
US6420084B1Jul 16, 2002
Mask-making using resist having SIO bond-containing polymer
IBM83 citations97
US6686124B1Feb 3, 2004
Multifunctional polymeric materials and use thereof
IBM67 citations96
US6561220B2May 13, 2003
Apparatus and method for increasing throughput in fluid processing
IBM71 citations96
US6210856B1Apr 3, 2001
Resist composition and process of forming a patterned resist layer on a substrate
IBM123 citations96
US6057080AMay 2, 2000
Top antireflective coating film
IBM86 citations96
US6043003AMar 28, 2000
E-beam application to mask making using new improved KRS resist system
IBM45 citations96
US6037097AMar 14, 2000
E-beam application to mask making using new improved KRS resist system
IBM50 citations96
US5744537AApr 28, 1998
Antireflective coating films
IBM72 citations96
US3934057AJan 20, 1976
High sensitivity positive resist layers and mask formation process
IBM53 citations96
US5554485ASep 10, 1996
Mid and deep-UV antireflection coatings and methods for use thereof
IBM56 citations95
US5401614AMar 28, 1995
Mid and deep-UV antireflection coatings and methods for use thereof
IBM68 citations95
US6451510B1Sep 17, 2002
Developer/rinse formulation to prevent image collapse in resist
IBM68 citations94
US5607824AMar 4, 1997
Antireflective coating for microlithography
IBM61 citations94
US5272042ADec 21, 1993
Positive photoresist system for near-UV to visible imaging
IBM68 citations94
US6656666B2Dec 2, 2003
Topcoat process to prevent image collapse
IBM27 citations92
US6653045B2Nov 25, 2003
Radiation sensitive silicon-containing negative resists and use thereof
IBM15 citations92
US6509136B1Jan 21, 2003
Process of drying a cast polymeric film disposed on a workpiece
IBM21 citations92
US5561194AOct 1, 1996
Photoresist composition including polyalkylmethacrylate co-polymer of polyhydroxystyrene
IBM54 citations92
US5164278ANov 17, 1992
Speed enhancers for acid sensitized resists
IBM41 citations92
US4880722ANov 14, 1989
Diazoquinone sensitized polyamic acid based photoresist compositions having reduced dissolution rates in alkaline developers
IBM25 citations92
US5240812AAug 31, 1993
Top coat for acid catalyzed resists
IBM35 citations90
US5023164AJun 11, 1991
Highly sensitive dry developable deep UV photoresist
IBM26 citations90
US6736906B2May 18, 2004
Turbine part mount for supercritical fluid processor
IBM16 citations84
US6136498AOct 24, 2000
Polymer-bound sensitizer
IBM19 citations83
US6875286B2Apr 5, 2005
Solid CO2 cleaning
IBM15 citations82
US6074800AJun 13, 2000
Photo acid generator compounds, photo resists, and method for improving bias
IBM16 citations81
US4011351AMar 8, 1977
Preparation of resist image with methacrylate polymers
IBM26 citations81
US7081208B2Jul 25, 2006
Method to build a microfilter
IBM9 citations74
US6927393B2Aug 9, 2005
Method of in situ monitoring of supercritical fluid process conditions
IBM8 citations74
US6821718B2Nov 23, 2004
Radiation sensitive silicon-containing negative resists and use thereof
IBM10 citations74
US5362599ANov 8, 1994
Fast diazoquinone positive resists comprising mixed esters of 4-sulfonate and 5-sulfonate compounds
IBM13 citations72
US4464458AAug 7, 1984
Process for forming resist masks utilizing O-quinone diazide and pyrene
IBM10 citations72
US3961099AJun 1, 1976
Thermally stable positive polycarbonate electron beam resists
IBM9 citations72
US3931435AJan 6, 1976
Electron beam positive resists containing acetate polymers
IBM14 citations72
US3996393ADec 7, 1976
Positive polymeric electron beam resists of very great sensitivity
IBM14 citations70
US5227280AJul 13, 1993
Resists with enhanced sensitivity and contrast
IBM16 citations69
US4942108AJul 17, 1990
Process of making diazoquinone sensitized polyamic acid based photoresist compositions having reduced dissolution rates in alkaline developers
IBM13 citations69
US6495825B1Dec 17, 2002
Apparatus for photo exposure of materials with subsequent capturing of volatiles for analysis
IBM7 citations67
US7288155B2Oct 30, 2007
Method for the rapid thermal control of a work piece in liquid or supercritical fluid
IBM3 citations63
US6821488B1Nov 23, 2004
Sample holding chuck for use in reactor and reactor using same
IBM4 citations63
US6383712B1May 7, 2002
Polymer-bound sensitizer
IBM3 citations62
US6586156B2Jul 1, 2003
Etch improved resist systems containing acrylate (or methacrylate) silane monomers
IBM6 citations61
US3985915AOct 12, 1976
Use of nitrocellulose containing 10.5 to 12% nitrogen as electron beam positive resists
IBM4 citations61
SIMONS JOHN P
2 patentsSHIPLEY CO LLC
1 patentLNTERNAT BUSINESS MACHINES COR
1 patentCLARIANT FINANCE BVI LTD
1 patentShowing the top 50 of 52 patents by PatentIndex Score.