P

Inventor

MOREAU WAYNE M

US52 patents
⚠️ This page may combine multiple inventors who share the name “MOREAU WAYNE M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

45 patents
US6420088B1Jul 16, 2002

Antireflective silicon-containing compositions as hardmask layer

IBM214 citations98
US6503692B2Jan 7, 2003

Antireflective silicon-containing compositions as hardmask layer

IBM85 citations97
US6420084B1Jul 16, 2002

Mask-making using resist having SIO bond-containing polymer

IBM83 citations97
US6686124B1Feb 3, 2004

Multifunctional polymeric materials and use thereof

IBM67 citations96
US6561220B2May 13, 2003

Apparatus and method for increasing throughput in fluid processing

IBM71 citations96
US6210856B1Apr 3, 2001

Resist composition and process of forming a patterned resist layer on a substrate

IBM123 citations96
US6057080AMay 2, 2000

Top antireflective coating film

IBM86 citations96
US6043003AMar 28, 2000

E-beam application to mask making using new improved KRS resist system

IBM45 citations96
US6037097AMar 14, 2000

E-beam application to mask making using new improved KRS resist system

IBM50 citations96
US5744537AApr 28, 1998

Antireflective coating films

IBM72 citations96
US3934057AJan 20, 1976

High sensitivity positive resist layers and mask formation process

IBM53 citations96
US5554485ASep 10, 1996

Mid and deep-UV antireflection coatings and methods for use thereof

IBM56 citations95
US5401614AMar 28, 1995

Mid and deep-UV antireflection coatings and methods for use thereof

IBM68 citations95
US6451510B1Sep 17, 2002

Developer/rinse formulation to prevent image collapse in resist

IBM68 citations94
US5607824AMar 4, 1997

Antireflective coating for microlithography

IBM61 citations94
US5272042ADec 21, 1993

Positive photoresist system for near-UV to visible imaging

IBM68 citations94
US6656666B2Dec 2, 2003

Topcoat process to prevent image collapse

IBM27 citations92
US6653045B2Nov 25, 2003

Radiation sensitive silicon-containing negative resists and use thereof

IBM15 citations92
US6509136B1Jan 21, 2003

Process of drying a cast polymeric film disposed on a workpiece

IBM21 citations92
US5561194AOct 1, 1996

Photoresist composition including polyalkylmethacrylate co-polymer of polyhydroxystyrene

IBM54 citations92
US5164278ANov 17, 1992

Speed enhancers for acid sensitized resists

IBM41 citations92
US4880722ANov 14, 1989

Diazoquinone sensitized polyamic acid based photoresist compositions having reduced dissolution rates in alkaline developers

IBM25 citations92
US5240812AAug 31, 1993

Top coat for acid catalyzed resists

IBM35 citations90
US5023164AJun 11, 1991

Highly sensitive dry developable deep UV photoresist

IBM26 citations90
US6736906B2May 18, 2004

Turbine part mount for supercritical fluid processor

IBM16 citations84
US6136498AOct 24, 2000

Polymer-bound sensitizer

IBM19 citations83
US6875286B2Apr 5, 2005

Solid CO2 cleaning

IBM15 citations82
US6074800AJun 13, 2000

Photo acid generator compounds, photo resists, and method for improving bias

IBM16 citations81
US4011351AMar 8, 1977

Preparation of resist image with methacrylate polymers

IBM26 citations81
US7081208B2Jul 25, 2006

Method to build a microfilter

IBM9 citations74
US6927393B2Aug 9, 2005

Method of in situ monitoring of supercritical fluid process conditions

IBM8 citations74
US6821718B2Nov 23, 2004

Radiation sensitive silicon-containing negative resists and use thereof

IBM10 citations74
US5362599ANov 8, 1994

Fast diazoquinone positive resists comprising mixed esters of 4-sulfonate and 5-sulfonate compounds

IBM13 citations72
US4464458AAug 7, 1984

Process for forming resist masks utilizing O-quinone diazide and pyrene

IBM10 citations72
US3961099AJun 1, 1976

Thermally stable positive polycarbonate electron beam resists

IBM9 citations72
US3931435AJan 6, 1976

Electron beam positive resists containing acetate polymers

IBM14 citations72
US3996393ADec 7, 1976

Positive polymeric electron beam resists of very great sensitivity

IBM14 citations70
US5227280AJul 13, 1993

Resists with enhanced sensitivity and contrast

IBM16 citations69
US4942108AJul 17, 1990

Process of making diazoquinone sensitized polyamic acid based photoresist compositions having reduced dissolution rates in alkaline developers

IBM13 citations69
US6495825B1Dec 17, 2002

Apparatus for photo exposure of materials with subsequent capturing of volatiles for analysis

IBM7 citations67
US7288155B2Oct 30, 2007

Method for the rapid thermal control of a work piece in liquid or supercritical fluid

IBM3 citations63
US6821488B1Nov 23, 2004

Sample holding chuck for use in reactor and reactor using same

IBM4 citations63
US6383712B1May 7, 2002

Polymer-bound sensitizer

IBM3 citations62
US6586156B2Jul 1, 2003

Etch improved resist systems containing acrylate (or methacrylate) silane monomers

IBM6 citations61
US3985915AOct 12, 1976

Use of nitrocellulose containing 10.5 to 12% nitrogen as electron beam positive resists

IBM4 citations61

SIMONS JOHN P

2 patents

SHIPLEY CO LLC

1 patent

LNTERNAT BUSINESS MACHINES COR

1 patent

CLARIANT FINANCE BVI LTD

1 patent

Showing the top 50 of 52 patents by PatentIndex Score.