Inventor
YANG SHIH-HSIEN
TW28 patents
⚠️ This page may combine multiple inventors who share the name “YANG SHIH-HSIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WINBOND ELECTRONICS CORP
8 patentsUS6185125B1Feb 6, 2001
Circuit for measuring the data retention time of a dynamic random-access memory cell
WINBOND ELECTRONICS CORP23 citations92
US6845347B1Jan 18, 2005
Method for modeling an integrated circuit including a DRAM cell
WINBOND ELECTRONICS CORP9 citations74
US6377067B1Apr 23, 2002
Testing method for buried strap and deep trench leakage current
WINBOND ELECTRONICS CORP7 citations73
US6828219B2Dec 7, 2004
Stacked spacer structure and process
WINBOND ELECTRONICS CORP9 citations71
US6776622B2Aug 17, 2004
Conductive contact structure and process for producing the same
WINBOND ELECTRONICS CORP8 citations71
US6847557B2Jan 25, 2005
Method of erasing non-volatile memory data
WINBOND ELECTRONICS CORP5 citations62
US6862219B2Mar 1, 2005
Weak programming method of non-volatile memory
WINBOND ELECTRONICS CORP1 citations47
US6055195AApr 25, 2000
Delay circuit and delay chain circuit for measurement of the charge/discharge period of dynamic random access memory
WINBOND ELECTRONICS CORP0 citations41