Inventor · disambiguated record

Derk Onck

Also filed as: ONCK DERK

1 granted patent·0 citations·filing 2020–2020

6Inventor score

Technology areasG03F

Files withASML NETHERLANDS BV1

Top patents by PatentIndex Score

1 record

0153US12443115B2Measurement system and method for characterizing a patterning deviceASML NETHERLANDS BV·Filed 2020·Granted Oct 14, 2025·0 cites·15 claims

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