Inventor
WONG I-HSIEH
TW31 patents
⚠️ This page may combine multiple inventors who share the name “WONG I-HSIEH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
29 patentsUS11456383B2Sep 27, 2022
Semiconductor device having a contact plug with an air gap spacer
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations86
US11189705B2Nov 30, 2021
Methods of reducing parasitic capacitance in multi-gate field-effect transistors
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10332985B2Jun 25, 2019
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations82
US11973122B2Apr 30, 2024
Nano-FET semiconductor device and method of forming
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11362199B2Jun 14, 2022
Semiconductor device and method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10777426B2Sep 15, 2020
Semiconductor device and formation thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US9847233B2Dec 19, 2017
Semiconductor device and formation thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11205597B2Dec 21, 2021
Semiconductor device and method
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations66
US12382703B2Aug 5, 2025
Spacer features for nanosheet-based devices
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations63
US12432963B2Sep 30, 2025
Device having an air gap adjacent to a contact plug and covered by a doped dielectric layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12382692B2Aug 5, 2025
Dielectric inner spacers in multi-gate field-effect transistors
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12363950B2Jul 15, 2025
Nano-FET semiconductor device and method of forming
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12237232B2Feb 25, 2025
Methods for forming source/drain features
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11901455B2Feb 13, 2024
Method of manufacturing a FinFET by implanting a dielectric with a dopant
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11626505B2Apr 11, 2023
Dielectric inner spacers in multi-gate field-effect transistors
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11404284B2Aug 2, 2022
Semiconductor device and formation thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11631768B2Apr 18, 2023
Semiconductor device and method of manufacturing thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10957784B2Mar 23, 2021
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations61
US12308371B2May 20, 2025
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11791410B2Oct 17, 2023
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11063149B2Jul 13, 2021
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12402379B2Aug 26, 2025
Epitaxial layer under a gate structure of a transistor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11901415B2Feb 13, 2024
Transistor isolation structures
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations59
US12588283B2Mar 24, 2026
Semiconductor structure and related methods
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US11949002B2Apr 2, 2024
Semiconductor device and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US11728344B2Aug 15, 2023
Hybrid SRAM design with nano-structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10510888B2Dec 17, 2019
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10340383B2Jul 2, 2019
Semiconductor device having stressor layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10068995B2Sep 4, 2018
Semiconductor device including field effect transistor and a method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41