Inventor · disambiguated record
Justin W. Wong
Also filed as: WONG JUSTIN · WONG JUSTIN W · WONG JUSTIN W-C · WONG JUSTIN WAI-CHOW
25 granted patents·4 pending applications·1,412 citations·filing 1994–2012
97Inventor score
Top patents by PatentIndex Score
29 records- 0198US5431734AAluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical controlIBM·Filed 1994·Granted Jul 11, 1995·431 cites·4 claims
- 0297US5665608AMethod of aluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical controlIBM·Filed 1995·Granted Sep 9, 1997·478 cites·4 claims
- 0393US8140301B2Method and system for causal modeling and outlier detectionABE NAOKI·Filed 2007·Granted Mar 20, 2012·42 cites·16 claims
- 0492US7493236B1Method for reporting the status of a control application in an automated manufacturing environmentIBM·Filed 2007·Granted Feb 17, 2009·42 cites·18 claims
- 0590US7793162B2Method for reporting the status and drill-down of a control application in an automated manufacturing environmentIBM·Filed 2007·Granted Sep 7, 2010·29 cites·20 claims
- 0685US7805639B2Tool to report the status and drill-down of an application in an automated manufacturing environmentIBM·Filed 2007·Granted Sep 28, 2010·15 cites·26 claims
- 0783US7864502B2In situ monitoring of wafer charge distribution in plasma processingIBM·Filed 2007·Granted Jan 4, 2011·17 cites·27 claims
- 0881US8233494B2Hierarchical and incremental multivariate analysis for process controlAMINI LISA·Filed 2008·Granted Jul 31, 2012·13 cites·20 claims
- 0980US7835814B2Tool for reporting the status and drill-down of a control application in an automated manufacturing environmentIBM·Filed 2007·Granted Nov 16, 2010·11 cites·20 claims
- 1078US8634949B2Manufacturing management using tool operating dataBARKER BRIAN C·Filed 2010·Granted Jan 21, 2014·8 cites·20 claims
- 1176US5788801AReal time measurement of etch rate during a chemical etching processIBM·Filed 1997·Granted Aug 4, 1998·49 cites·6 claims
- 1273US5614247AApparatus for chemical vapor deposition of aluminum oxideIBM·Filed 1994·Granted Mar 25, 1997·32 cites·5 claims
- 1370US8260034B2Multi-modal data analysis for defect identificationAMINI LISA·Filed 2008·Granted Sep 4, 2012·2 cites·1 claims
- 1470US5728222AApparatus for chemical vapor deposition of aluminum oxideIBM·Filed 1995·Granted Mar 17, 1998·33 cites·10 claims
- 1569US5648113AAluminum oxide LPCVD systemIBM·Filed 1994·Granted Jul 15, 1997·25 cites·12 claims
- 1666US5516399AContactless real-time in-situ monitoring of a chemical etchingIBM·Filed 1994·Granted May 14, 1996·40 cites·18 claims
- 1765US5501766AMinimizing overetch during a chemical etching processIBM·Filed 1994·Granted Mar 26, 1996·26 cites·15 claims
- 1858US7115210B2Measurement to determine plasma leakageIBM·Filed 2004·Granted Oct 3, 2006·5 cites·14 claims
- 1956US5573624AChemical etch monitor for measuring film etching uniformity during a chemical etching processIBM·Filed 1994·Granted Nov 12, 1996·26 cites·10 claims
- 2056US5540777AAluminum oxide LPCVD systemIBM·Filed 1995·Granted Jul 30, 1996·17 cites·7 claims
- 2154US2013103336A1Multi-modal data analysis for defect identificationAMINI LISA·Filed 2012·Application pending·0 cites
- 2253US5582746AReal time measurement of etch rate during a chemical etching processIBM·Filed 1994·Granted Dec 10, 1996·19 cites·11 claims
- 2353US5500073AReal time measurement of etch rate during a chemical etching processIBM·Filed 1995·Granted Mar 19, 1996·15 cites·15 claims
- 2446US5489361AMeasuring film etching uniformity during a chemical etching processIBM·Filed 1994·Granted Feb 6, 1996·15 cites·5 claims
- 2545US5425810ARemovable gas injectors for use in chemical vapor deposition of aluminium oxideIBM·Filed 1994·Granted Jun 20, 1995·10 cites·6 claims
- 2644US2010063610A1Method of process modules performance matchingANGELL DAVID·Filed 2008·Application pending·0 cites
- 2743US6121064ASTI fill for SOI which makes SOI inspectableIBM·Filed 1999·Granted Sep 19, 2000·12 cites·27 claims
- 2843US2009137068A1Method and Computer Program Product for Wafer Manufacturing Process Abnormalities DetectionROSEN-ZVI MICHAL·Filed 2007·Application pending·0 cites
- 2941US2010014748A1Method and apparatus for real time fault detection in high speed semiconductor processesIBM·Filed 2008·Application pending·0 cites
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