P

Inventor

MATSUMOTO TAKAHIRO

JP176 patents
⚠️ This page may combine multiple inventors who share the name “MATSUMOTO TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CANON KK

27 patents
US6304318B1Oct 16, 2001

Lithography system and method of manufacturing devices using the lithography system

CANON KK168 citations99
US6421124B1Jul 16, 2002

Position detecting system and device manufacturing method using the same

CANON KK106 citations98
US6285033B1Sep 4, 2001

Positional deviation detecting method and device manufacturing method using the same

CANON KK45 citations96
US6151120ANov 21, 2000

Exposure apparatus and method

CANON KK74 citations96
US5465148ANov 7, 1995

Apparatus and method for detecting the relative positional deviation between two diffraction gratings

CANON KK59 citations96
US5625453AApr 29, 1997

System and method for detecting the relative positional deviation between diffraction gratings and for measuring the width of a line constituting a diffraction grating

CANON KK93 citations94
US6999893B2Feb 14, 2006

Position detecting device and position detecting method

CANON KK14 citations93
US6992767B2Jan 31, 2006

Management system, apparatus, and method, exposure apparatus, and control method therefor

CANON KK21 citations93
US6785583B2Aug 31, 2004

Management system and apparatus, method therefor, and device manufacturing method

CANON KK19 citations93
US6649923B2Nov 18, 2003

Positional deviation detecting method and device manufacturing method using the same

CANON KK27 citations93
US6559924B2May 6, 2003

Alignment method, alignment apparatus, profiler, exposure apparatus, exposure apparatus maintenance method, semiconductor device manufacturing method, and semiconductor manufacturing factory

CANON KK37 citations93
US6344892B1Feb 5, 2002

Exposure apparatus and device manufacturing method using same

CANON KK34 citations93
US5847974ADec 8, 1998

Measuring method and apparatus for measuring system having measurement error changeable with time

CANON KK24 citations93
US5818588AOct 6, 1998

Displacement measuring method and apparatus using plural light beam beat frequency signals

CANON KK33 citations93
US5751426AMay 12, 1998

Positional deviation measuring device and method for measuring the positional deviation between a plurality of diffraction gratings formed on the same object

CANON KK37 citations93
US5682239AOct 28, 1997

Apparatus for detecting positional deviation of diffraction gratings on a substrate by utilizing optical heterodyne interference of light beams incident on the gratings from first and second light emitters

CANON KK37 citations93
US5610718AMar 11, 1997

Apparatus and method for detecting a relative displacement between first and second diffraction gratings arranged close to each other wherein said gratings have different pitch sizes

CANON KK40 citations93
US5585923ADec 17, 1996

Method and apparatus for measuring positional deviation while correcting an error on the basis of the error detection by an error detecting means

CANON KK29 citations93
US5559598ASep 24, 1996

Apparatus for detecting misalignment between diffraction gratings and the position of a diffraction grating based on the phases or the phase difference between electrical signals

CANON KK48 citations93
US5432603AJul 11, 1995

Optical heterodyne interference measuring apparatus and method, and exposing apparatus and device manufacturing method using the same, in which a phase difference between beat signals is detected

CANON KK36 citations93
US5369486ANov 29, 1994

Position detector for detecting the position of an object using a diffraction grating positioned at an angle

CANON KK51 citations93
US5321502AJun 14, 1994

Measuring method and measuring apparatus

CANON KK25 citations93
US9625836B2Apr 18, 2017

Interferometer, lithography apparatus, and method of manufacturing article

CANON KK10 citations84
US9201298B2Dec 1, 2015

Imprint method, imprint apparatus, and article manufacturing method

CANON KK6 citations84
US7528966B2May 5, 2009

Position detection apparatus and exposure apparatus

CANON KK11 citations84
US7229566B2Jun 12, 2007

Position detecting method and apparatus

CANON KK15 citations84
US7103497B2Sep 5, 2006

Position detecting device and position detecting method

CANON KK12 citations84

MITSUBISHI ELECTRIC CORP

5 patents

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

5 patents

TAKEDA PHARMACEUTICALS CO

4 patents

MITSUBISHI HEAVY IND LTD

2 patents

TAKEDA PHARMACEUTICAL

2 patents

HITACHI LTD

1 patent

MITSUBISHI GAS CHEMICAL CO

1 patent

NIPPON STEEL CORP

1 patent

HARUMOTO YOSHINOBU

1 patent

MORIC KK

1 patent

Showing the top 50 of 176 patents by PatentIndex Score.