Inventor
SHIH CHI-YUAN
TW61 patents
⚠️ This page may combine multiple inventors who share the name “SHIH CHI-YUAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
34 patentsUS10032889B2Jul 24, 2018
Self-aligned passivation of active regions
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9553025B2Jan 24, 2017
Selective Fin-shaping process
TAIWAN SEMICONDUCTOR MFG CO LTD14 citations84
US9455325B2Sep 27, 2016
Fin field-effect transistors having controlled fin height
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations83
US9953975B2Apr 24, 2018
Methods for forming STI regions in integrated circuits
TAIWAN SEMICONDUCTOR MFG CO LTD11 citations82
US10535573B2Jan 14, 2020
System and method for test key characterizing wafer processing state
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9530710B2Dec 27, 2016
Passivation structure of fin field effect transistor
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US12237227B2Feb 25, 2025
Semiconductor device and method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11856862B2Dec 26, 2023
Fatigue-free bipolar loop treatment to reduce imprint effect in piezoelectric device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11456330B2Sep 27, 2022
Fatigue-free bipolar loop treatment to reduce imprint effect in piezoelectric device
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9627280B2Apr 18, 2017
Methods for probing semiconductor fins through four-point probe and determining carrier concentrations
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US11855219B2Dec 26, 2023
Passivated and faceted for fin field effect transistor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11158743B2Oct 26, 2021
Passivated and faceted for fin field effect transistor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12587284B2Mar 24, 2026
High speed optical receiver system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12232424B2Feb 18, 2025
Fatigue-free bipolar loop treatment to reduce imprint effect in piezoelectric device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12166067B2Dec 10, 2024
Titanium layer as getter layer for hydrogen in a MIM device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12082505B2Sep 3, 2024
Integrated heater (and related method) to recover degraded piezoelectric device performance
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11984261B2May 14, 2024
Integration scheme for breakdown voltage enhancement of a piezoelectric metal-insulator-metal device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11730058B2Aug 15, 2023
Integrated heater (and related method) to recover degraded piezoelectric device performance
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11450661B2Sep 20, 2022
Forming STI regions to separate semiconductor Fins
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11322580B2May 3, 2022
Titanium layer as getter layer for hydrogen in a MIM device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11107630B2Aug 31, 2021
Integration scheme for breakdown voltage enhancement of a piezoelectric metal-insulator-metal device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10943995B2Mar 9, 2021
Self-aligned passivation of active regions
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10186602B2Jan 22, 2019
Fin structure of semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US9412847B2Aug 9, 2016
Self-aligned passivation of active regions
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62
US11289568B2Mar 29, 2022
Reduction of electric field enhanced moisture penetration by metal shielding
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12563822B2Feb 24, 2026
Semiconductor device and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12504579B2Dec 23, 2025
Wavelength tuning in silicon photonics
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations57
US12554059B2Feb 17, 2026
Waveguide photodetector and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10381482B2Aug 13, 2019
Passivated and faceted for fin field effect transistor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10269666B2Apr 23, 2019
System and method for test key characterizing wafer processing state
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10164070B2Dec 25, 2018
Self-aligned passivation of active regions
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10115597B2Oct 30, 2018
Self-aligned dual-metal silicide and germanide formation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10043908B2Aug 7, 2018
Contact structure of semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9680021B2Jun 13, 2017
Passivated and faceted fin field effect transistor
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
TAIWAN SEMICONDUCTOR MFG
6 patentsUS9287262B2Mar 15, 2016
Passivated and faceted for fin field effect transistor
TAIWAN SEMICONDUCTOR MFG13 citations93
US9214556B2Dec 15, 2015
Self-aligned dual-metal silicide and germanide formation
TAIWAN SEMICONDUCTOR MFG23 citations92
US9337285B2May 10, 2016
Contact structure of semiconductor device
TAIWAN SEMICONDUCTOR MFG9 citations84
US9048317B2Jun 2, 2015
Contact structure of semiconductor device
TAIWAN SEMICONDUCTOR MFG6 citations84
US9093335B2Jul 28, 2015
Calculating carrier concentrations in semiconductor Fins using probed resistance
TAIWAN SEMICONDUCTOR MFG5 citations83
US9142474B2Sep 22, 2015
Passivation structure of fin field effect transistor
TAIWAN SEMICONDUCTOR MFG2 citations63
WANN CLEMENT HSINGJEN
4 patentsUS8946829B2Feb 3, 2015
Selective fin-shaping process using plasma doping and etching for 3-dimensional transistor applications
WANN CLEMENT HSINGJEN17 citations92
US9136383B2Sep 15, 2015
Contact structure of semiconductor device
WANN CLEMENT HSINGJEN13 citations84
US8963257B2Feb 24, 2015
Fin field effect transistors and methods for fabricating the same
WANN CLEMENT HSINGJEN8 citations84
US9041158B2May 26, 2015
Method of forming fin field-effect transistors having controlled fin height
WANN CLEMENT HSINGJEN8 citations83
SHIH CHI-YUAN
3 patentsUS8592287B2Nov 26, 2013
Overlay alignment mark and method of detecting overlay alignment error using the mark
SHIH CHI-YUAN7 citations83
US8183701B2May 22, 2012
Structure of stacking scatterometry based overlay marks for marks footprint reduction
SHIH CHI-YUAN7 citations82
US8574432B2Nov 5, 2013
Integrated chromatography devices and systems for monitoring analytes in real time and methods for manufacturing the same
SHIH CHI-YUAN3 citations60
CALIFORNIA INST OF TECHN
2 patentsWU CHIH-JEN
1 patentShowing the top 50 of 61 patents by PatentIndex Score.