Inventor · disambiguated record

Thomas Bristow

Also filed as: BRISTOW THOMAS · BRISTOW THOMAS C

2 granted patents·11 citations·filing 2004–2006

55Inventor score

Technology areasG01B

Files withCHAPMAN INSTR INC2

Top patents by PatentIndex Score

2 records

0164US7283256B2Method and apparatus for measuring wafer thicknessCHAPMAN INSTR INC·Filed 2006·Granted Oct 16, 2007·7 cites·6 claims
0241US7280232B2Method and apparatus for measuring wafer thicknessCHAPMAN INSTR INC·Filed 2004·Granted Oct 9, 2007·4 cites·11 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →