Inventor
LEE JAE HYEONG
KR19 patents
⚠️ This page may combine multiple inventors who share the name “LEE JAE HYEONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
12 patentsUS6034916AMar 7, 2000
Data masking circuits and methods for integrated circuit memory devices, including data strobe signal synchronization
SAMSUNG ELECTRONICS CO LTD149 citations98
US6498766B2Dec 24, 2002
Integrated circuit memory devices that utilize indication signals to increase reliability of reading and writing operations and methods of operating same
SAMSUNG ELECTRONICS CO LTD137 citations97
US6459651B1Oct 1, 2002
Semiconductor memory device having data masking pin and memory system including the same
SAMSUNG ELECTRONICS CO LTD89 citations97
US5467032ANov 14, 1995
Word line driver circuit for a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD92 citations95
US6285225B1Sep 4, 2001
Delay locked loop circuits and methods of operation thereof
SAMSUNG ELECTRONICS CO LTD52 citations92
US6058495AMay 2, 2000
Multi-bit test circuit in semiconductor memory device and method thereof
SAMSUNG ELECTRONICS CO LTD31 citations92
US5715206AFeb 3, 1998
Dynamic random access memory having sequential word line refresh
SAMSUNG ELECTRONICS CO LTD24 citations92
US5590079ADec 31, 1996
Wafer burn-in test circuit of a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD47 citations92
US5687128ANov 11, 1997
Power supply voltage boosting circuit of semiconductor memory device
SAMSUNG ELECTRONICS CO LTD16 citations73
US6965528B2Nov 15, 2005
Memory device having high bus efficiency of network, operating method of the same, and memory system including the same
SAMSUNG ELECTRONICS CO LTD3 citations63
US6901018B2May 31, 2005
Method of generating initializing signal in semiconductor memory device
SAMSUNG ELECTRONICS CO LTD5 citations62
US7173871B2Feb 6, 2007
Semiconductor memory device and method of outputting data strobe signal thereof
SAMSUNG ELECTRONICS CO LTD2 citations60
SK SILTRON CO LTD
4 patentsUS11955386B2Apr 9, 2024
Method for evaluating defective region of wafer
SK SILTRON CO LTD0 citations62
US10325823B2Jun 18, 2019
Wafer and wafer defect analysis method
SK SILTRON CO LTD1 citations62
US10541181B2Jan 21, 2020
Wafer and wafer defect analysis method
SK SILTRON CO LTD0 citations51
US10634622B2Apr 28, 2020
Method of identifying defect regions in wafer
SK SILTRON CO LTD0 citations41